Temperature variation effects in MCTs, IGBTs, and BMFETs

PESC Record - IEEE Annual Power Electronics Specialists Conference

Volumn , Issue , 1993, Pages 93-98

  Godbold, C V ^a   Hudgins, J L ^a   Braun, C ^a   Portnoy, W M ^a  

^a UNIVERSITY OF SOUTH CAROLINA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; GATES (TRANSISTOR); MOS DEVICES; SWITCHING CIRCUITS; THERMAL EFFECTS; THYRISTORS;

BMFETS; INSULATED GATE BIPOLAR TRANSISTORS; MOS CONTROLLED THYRISTORS; TEMPERATURE VARIATION EFFECTS;

BIPOLAR TRANSISTORS;

EID: 0027806917     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)