Partial scan at the register-transfer level

Proceedings of the International Test Conference

Volumn , Issue , 1993, Pages 488-497

  Steensma, Johannes ^a   Catthoor, Francky ^a   De Man, Hugo ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; CONTROLLABILITY; DATA TRANSFER; DIGITAL SIGNAL PROCESSING; ELECTRIC FAULT LOCATION; OBSERVABILITY; PARALLEL PROCESSING SYSTEMS; SHIFT REGISTERS;

DATA PATHS; PARTIAL SCAN METHODOLOGY; REGISTER-TRANSFER LEVEL; SCAN REGISTERS; TEST PATTERN GENERATION;

SEQUENTIAL CIRCUITS;

EID: 0027804593     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)