메뉴 건너뛰기





Volumn , Issue , 1993, Pages 191-204

Effects of test procedures and sequences on the performance of tin-plated connectors

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CORROSION PROTECTION; ELECTRIC CONTACTS; ELECTRIC RESISTANCE; FAILURE (MECHANICAL); INTERFACES (MATERIALS); MATERIALS TESTING; PLATING; PROTECTIVE COATINGS; THERMAL STRESS; TIN PLATE;

EID: 0027800842     PISSN: 03614395     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (25)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.