Test features of the HP PA7100LC processor

Proceedings of the International Test Conference

Volumn , Issue , 1993, Pages 764-772

  Josephson, Don D ^a   Dixon, Daniel J ^a   Arnold, Barry J ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER CIRCUITS; COMPUTER HARDWARE; COMPUTER TESTING; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; PROGRAM PROCESSORS; REDUCED INSTRUCTION SET COMPUTING;

HARDWARE ASSISTED INSTRUCTION BUFFER TEST; HEWLETT PACKARD PA7100LC PROCESSOR; INTERNAL TEST; SPEED INTERNAL STATE CAPTURE;

CMOS INTEGRATED CIRCUITS;

EID: 0027799159     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)