Test generation for path delay faults based on learning

Volumn , Issue , 1993, Pages 428-435

  Pomeranz, Irith ^a   Reddy, Sudhakar M ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; ERROR ANALYSIS; ERROR DETECTION; LEARNING SYSTEMS; MATHEMATICAL MODELS;

LEARNING BASED METHODS; PATH DELAY FAULTS; TEST GENERATION;

COMBINATORIAL CIRCUITS;

EID: 0027798181     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)