Nanoindentation studies of sublimed fullerene films using atomic force microscopy

Journal of Materials Research

Volumn 8, Issue 12, 1993, Pages 3019-3022

  Ruan, Juai ^a   Bhushan, Bharat ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CARBON; CHEMICAL VAPOR DEPOSITION; DIAMONDS; FORCE MEASUREMENT; FRICTION; IONS; MICROSCOPIC EXAMINATION; MOLECULES; POWDERS; SURFACES;

ATOMIC FORCE MICROSCOPY; ATOMIC SCALE FRICTION; CANTILEVER DEFLECTION; FULLERENE MOLECULES; ION BOMBARDED FILMS; MATERIAL MANIPULATION; MATERIAL TRANSFER; NANOINDENTATION STUDIES; SUBLIMED FULLERENE FILMS;

THIN FILMS;

EID: 0027797526     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/JMR.1993.3019     Document Type: Article

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