Novel test pattern generators for pseudo-exhaustive testing

Proceedings of the International Test Conference

Volumn , Issue , 1993, Pages 1041-1050

  Srinivasan, Rajagopalan ^a   Gupta, Sandeep K ^a   Breuer, Melvin A ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CODES (SYMBOLS); ELECTRIC FAULT LOCATION; ELECTRIC NETWORK ANALYSIS; MATHEMATICAL MODELS; NUMERICAL ANALYSIS;

CIRCUIT OUTPUT CONE STRUCTURE; CODING THEORY; COMBINATORIAL BENCHMARK CIRCUITS; COMBINATORIAL FAULTS; PSEUDO EXHAUSTIVE TESTING; TEST PATTERN GENERATORS;

COMBINATORIAL CIRCUITS;

EID: 0027796542     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)