Polycrystalline diamond cutting element control using high frequency C-scan image processing

NDT and E International

Volumn 26, Issue 6, 1993, Pages 303-308

  Delebarre, C ^a   Bruneel, C ^a   Delwiche, R ^b   De Vos, I ^b  

^a INSTITUT D ELECTRONIQUE   (France)

^b D B Stratabit ^*  (Belgium)

Author keywords

defect detection; image processing; ultrasonic testing

Indexed keywords

CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; DIAMOND CUTTING TOOLS; FATIGUE OF MATERIALS; FATIGUE TESTING; IMAGE PROCESSING; MICROSCOPIC EXAMINATION; NONDESTRUCTIVE EXAMINATION; ULTRASONIC MEASUREMENT; WEAR RESISTANCE;

ABRASION RESISTANCE TESTING; C SCAN IMAGE PROCESSING; DEFECT DETECTION; MECHANICAL ABRASION RESISTANCE; NONLINEAR TESTING; POLYCRYSTALLINE DIAMOND CUTTING ELEMENT; SCANNING ACOUSTIC MICROSCOPY; ULTRASONIC FREQUENCY;

ULTRASONIC APPLICATIONS;

EID: 0027756285     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/0963-8695(93)90006-G     Document Type: Article

References (11)

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9. Acoustic signature of dispersive and orthotropic composites using a focused microscope
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11. Fatigue crack characterization by ultrasonic inspection