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Volumn 140, Issue 12, 1993, Pages 3624-3627

Boron Diffusion Through Pure Silicon Oxide and Oxynitride Used for Metal-Oxide-Semiconductor Devices

Author keywords

[No Author keywords available]

Indexed keywords

BORON; DIFFUSION; MATHEMATICAL MODELS; SILICON COMPOUNDS; SPECTROSCOPY;

EID: 0027753412     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/1.2221138     Document Type: Article
Times cited : (63)

References (15)
  • 13
    • 84975384917 scopus 로고
    • S. M. Sze, Editor, Chapter 7, McGraw-Hill, New York
    • J. C. C. Tsai, VLSI Technology, S. M. Sze, Editor, Chapter 7, McGraw-Hill, New York (1988).
    • (1988) VLSI Technology
    • Tsai, J.C.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.