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Volumn 29, Issue 6, 1993, Pages 1047-1052

FCBM—A field-induced charged-board model for electrostatic discharges

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC DISCHARGES; ELECTRIC FIELDS; ELECTRIC WAVEFORMS; ELECTROSTATICS; INTEGRATED CIRCUITS; PRINTED CIRCUIT BOARDS; SENSITIVITY ANALYSIS; WAVEFORM ANALYSIS;

EID: 0027701327     PISSN: 00939994     EISSN: 19399367     Source Type: Journal    
DOI: 10.1109/28.259711     Document Type: Article
Times cited : (25)

References (13)
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  • 2
    • 84941515588 scopus 로고
    • Human-Body Model Electrostatic Discharge Sensitivity Testing
    • Human-Body Model Electrostatic Discharge Sensitivity Testing, EOS/ESD Assoc. Standard No. 5, 1991.
    • (1991) EOS/ESD Assoc. StandardNo , Issue.5
  • 3
    • 84941511651 scopus 로고
    • Guide for ESD Test Methodologies and Criteria for Electronic Equipment
    • Guide for ESD Test Methodologies and Criteria for Electronic Equipment, ANSI Standard C63, 1990.
    • (1990) ANSI Standard C63
  • 5
    • 0024178207 scopus 로고
    • A microwave-bandwidth waveform monitor for charged-device model simulators
    • Sept
    • R. G. Renninger, D. L. Lin, M. C. Jon, T. Diep, and T. L. Welsher, “A microwave-bandwidth waveform monitor for charged-device model simulators,” in EOS/ESD Symposium Proc., vol. EOS-10, Sept. 1988, pp. 162–171.
    • (1988) EOS/ESD Symposium Proc. , vol.EOS-10 , pp. 162-171
    • Renninger, R.G.1    Lin, D.L.2    Jon, M.C.3    Diep, T.4    Welsher, T.L.5
  • 6
    • 0000205383 scopus 로고
    • Electron multiplication and electrostatic discharge wave forms
    • Mar
    • D. L. Lin, “Electron multiplication and electrostatic discharge wave forms,” J. Applied Physics, vol. 71, pp. 2580–2586, Mar. 1992.
    • (1992) J. Applied Physics , vol.71 , pp. 2580-2586
    • Lin, D.L.1
  • 7
    • 0343520392 scopus 로고
    • Calculations of electrical breakdown in air at near-atmospheric pressure
    • May
    • A. L. Ward, “Calculations of electrical breakdown in air at near-atmospheric pressure,” Physical Rev., vol. 138, pp. 1357–1362, May 1965.
    • (1965) Physical Rev. , vol.138 , pp. 1357-1362
    • Ward, A.L.1
  • 9
    • 84950870887 scopus 로고
    • A survey of electron swarm data
    • J. Dutton, “A survey of electron swarm data,” J. Physical. Chem. Ref. Data, vol. 4, pp. 577–856, 1975.
    • (1975) J. Physical. Chem. Ref. Data , vol.4 , pp. 577-856
    • Dutton, J.1
  • 10
    • 30044443165 scopus 로고
    • From lightning to charged-device model electrostatic discharges
    • (in press) Sept
    • D. L. Lin and T. L. Welsher, “From lightning to charged-device model electrostatic discharges,” in Proc. 1992 EOS/ESD Symp., vol. EOS-14 (in press), Sept. 1992.
    • (1992) Proc. 1992 EOS/ESD Symp. , vol.EOS-14
    • Lin, D.L.1    Welsher, T.L.2
  • 11
    • 84941504312 scopus 로고    scopus 로고
    • An experimental investigation of the electrostatic discharge mechanism in packaged semiconductor devices
    • unpublished
    • M. C. Jon and T. L. Welsher, “An experimental investigation of the electrostatic discharge mechanism in packaged semiconductor devices,” unpublished.
    • Jon, M.C.1    Welsher, T.L.2
  • 12
    • 33745592427 scopus 로고
    • Measurement of the current during the formative time lag of sparks in uniform fields in air
    • Sept
    • H. W. Bandel, “Measurement of the current during the formative time lag of sparks in uniform fields in air,” Physical Rev., vol. 95, pp. 1117–1125, Sept. 1954.
    • (1954) Physical Rev. , vol.95 , pp. 1117-1125
    • Bandel, H.W.1
  • 13
    • 0004172549 scopus 로고    scopus 로고
    • Electrical breakdown of gases
    • New York: Oxford
    • J. M. Meek and J. D. Craggs. Electrical breakdown of gases. New York: Oxford, 1953, p. 291.
    • Meek, J.M.1    Craggs, J.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.