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Volumn E76-C, Issue 11, 1993, Pages 1604-1610
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Minority carrier collection in 256 M-bit DRAM cell on incidence of alpha-particle analyzed by three-dimensional device simulation
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ALPHA PARTICLES;
CHARGE CARRIERS;
COMPUTER SIMULATION;
DATA REDUCTION;
ELECTRON ABSORPTION;
ERROR ANALYSIS;
SEMICONDUCTOR DEVICE MODELS;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR JUNCTIONS;
SEMICONDUCTOR STORAGE;
MINORITY CARRIER COLLECTION;
SOFT ERROR;
RANDOM ACCESS STORAGE;
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EID: 0027701075
PISSN: 09168524
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (1)
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References (7)
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