SCOPUS 정보 검색 플랫폼

Volumn 9, Issue 6, 1993, Pages 477-482

Localization and characterization of latch‐up sensitive areas using a laser beam: Influence on design rules of ICs in CMOS technology

Author keywords

Contactless testing; Design rules; Laser; Latch up

Indexed keywords

DESIGN; ELECTRIC CURRENTS; LASER BEAMS; SIMULATION; TESTING;

CONTACTLESS TESTING; ELECTRICAL SIMULATIONS; LATCH-UP;

CMOS INTEGRATED CIRCUITS;

EID: 0027700682 PISSN: 07488017 EISSN: 10991638 Source Type: Journal
DOI: 10.1002/qre.4680090604 Document Type: Article

Times cited : (5)

References (7)

1
- 0003524785
- Kluwers Academic Publishers
- (1988) Latchup in CMOS Technology
- Troutman, R.R.¹

2
- 0022790119
- Correlations between CMOS latchup characteristics and substrate structure parameters
- (1986) Solid‐State Electronics , vol.29 , pp. 1079-1086
- Chen, M.J.¹ Wu, C.Y.²

3
- 84990682867
- HSPICE H8801 User's Manual, Meta‐Software, January
- (1988)
- Meta‐Software¹

4
- 84990682881
- ‘Contribution to the study of the interaction between a laser beam and a semiconductor. Application to the study of latchup and to the logic state analysis in CMOS technology’, Ph.D Thesis, Laboratoire IXL, University of Bordeaux I
- (1990)
- Fouillat, P.¹

5
- 84990694828
- ‘Laser beam silicium interaction: study of the distribution of the induced minority carriers’, 4th International Conference on Quality in Electronic Components, Bordeaux, France
- (1990)
- Fouillat, P.¹ Simonin, B.² Danto, Y.³ Dom, J.P.⁴

6
- 84990660446
- ‘Applications of an infrared laser scan microscope in device testing’, 2nd European Conference on Electron and Optical Beam Testing of ICs, Duisbourg, October
- (1989)
- Ziegler, E.¹

7
- 0023544996
- Laser beam testing of finished integrated circuits
- (1987) Microelectronic Engineering , vol.7 , pp. 363-370
- Auvert, G.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.