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Volumn 3, Issue 7 pt 3, 1993, Pages 2099-2104
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Recent developments in x-ray projection microscopy and x-ray microtomography applied to materials science
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFUSION;
MATERIALS SCIENCE;
SYNCHROTRON RADIATION;
X RAY MICROSCOPES;
WET ENVIRONMENT;
X RAY MICROTOMOGRAPHY;
X RAY ANALYSIS;
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EID: 0027699683
PISSN: 11554339
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1051/jp4:19937334 Document Type: Article |
Times cited : (25)
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References (16)
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