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Volumn 29, Issue 6, 1993, Pages 3906-3908

Interferometric Measurement of Disk/Slider Spacing: The Effect of Phase Shift on Reflection

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT; MAGNETIC HEADS; MEASUREMENTS; PHASE SHIFT; REFLECTION;

EID: 0027697706     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.281338     Document Type: Article
Times cited : (31)

References (7)
  • 1
    • 0004512713 scopus 로고
    • An application of white light interferometry in thin film measurements
    • May
    • Lin, C. and Sullivan, R. F., “An application of white light interferometry in thin film measurements,” IBMJ. Res. and Dev., p. 269, May 1972.
    • (1972) IBM J. Res. and Dev. , pp. 269
    • Lin, C.1    Sullivan, R.F.2
  • 2
    • 0019920914 scopus 로고
    • A visible laser interferometer for air bearing separation measurement to submicron accuracy
    • Jan.
    • Nigam, A., “A visible laser interferometer for air bearing separation measurement to submicron accuracy,” Trans. ASMEJ. Lub. Tech., p. 60, Jan. 1982.
    • (1982) Trans. ASMEJ. Lub. Tech. , pp. 60
    • Nigam, A.1
  • 3
    • 0023420955 scopus 로고
    • Comparison of optical and capacitive measurements of slider dynamics
    • Sept.
    • Best, G. L., “Comparison of optical and capacitive measurements of slider dynamics,” IEEE Trans. Mag., Vol. Mag 23, No. 5, p. 3453, Sept. 1987.
    • (1987) IEEE Trans. Mag. , vol.Mag 23 , Issue.5 , pp. 3453
    • Best, G.L.1
  • 4
    • 0004502753 scopus 로고
    • Estimation of the Zero Spacing Error Due to a Phase Shift of Reflected Light in Measuring a Magnetic Head Slider’s Flying Height by Light Interference
    • Muranushi, F., Tanaka, K., and Takeuchi, Y., “Estimation of the Zero Spacing Error Due to a Phase Shift of Reflected Light in Measuring a Magnetic Head Slider’s Flying Height by Light Interference,” Adv. Info. Storage Syst., Vol. 4, p. 371, 1992.
    • (1992) Adv. Info. Storage Syst. , vol.4 , pp. 371
    • Muranushi, F.1    Tanaka, K.2    Takeuchi, Y.3
  • 5
    • 0001821413 scopus 로고
    • Definitions and conventions in ellipsometry
    • Muller, R. H., “Definitions and conventions in ellipsometry,” Surface Science, Vol. 16, p. 14, 1969.
    • (1969) Surface Science , vol.16 , pp. 14
    • Muller, R.H.1
  • 7
    • 0004274166 scopus 로고
    • The Focal Press, London
    • Anders, Thin Films in Optics, The Focal Press, London, 1965.
    • (1965) Thin Films optics
    • Anders1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.