Characterization of the Broadband Transmission Behavior of Interconnections on Silicon Substrates

IEEE Transactions on Components, Hybrids, and Manufacturing Technology

Volumn 16, Issue 7, 1993, Pages 686-691

  Zaage, Stefan ^a   Grotelüschen, Enno ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; SEMICONDUCTING SILICON; TIME DOMAIN ANALYSIS;

BROADBAND TRANSMISSION BEHAVIOR; CONDUCTIVE SILICON SUBSTRATES; HIGH SPEED DIGITAL CIRCUITS; INTERCONNECTIONS; LINE GEOMETRY; SUBSTRATE RESISTIVITY;

DIGITAL INTEGRATED CIRCUITS;

EID: 0027696514     PISSN: 01486411     EISSN: None     Source Type: Journal    
DOI: 10.1109/33.257866     Document Type: Article

References (7)

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