Microstructural Origin of the Perpendicular Anisotropy in M-Type Barium Hexaferrite Thin Films Deposited by RF Magnetron Sputtering

IEEE Transactions on Magnetics

Volumn 29, Issue 6, 1993, Pages 3751-3753

  Sui, Xiaoyu ^a   Kryder, Mark H ^a   Wong, Bunsen Y ^a   Laughlin, David E ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; FERRITES; MAGNETIZATION; MICROSTRUCTURE; SPUTTERING;

BARIUM HEXAFERRITE; MICRODIFFRACTION STUDIES; PERPENDICULAR ANISOTROPY; PLATELETS;

THIN FILMS;

EID: 0027695037     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.281291     Document Type: Article

References (10)

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2. M. Matsuoka, Y. Hoshi, M. Naoe and S. Yamada, “Preparation of Ba-ferrite Films for Perpendicular Magnetic Recording by rf Target Facing Type of Sputtering”, IEEE Trans. Mag., MAG-20, pp. 800–802, 1984.
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