Study of structure and polymerization of epitaxially grown SiPc(OH)2 thin films by high‐resolution electron microscopy

Journal of Polymer Science Part B: Polymer Physics

Volumn 31, Issue 12, 1993, Pages 1713-1723

  Kawase, Noboru ^a,b   Kurata, Hiroki ^a   Kubono, Koji ^a   Isoda, Seiji ^a   Kobayashi, Takashi ^a  

^a KYOTO UNIVERSITY   (Japan)

^b TORAY RESEARCH CENTER INC   (Japan)

Author keywords

crystal structure; epitaxial growth; high resolution electron microscopy; molecular imaging; phthalocyanine siloxane; polymerization

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; EPITAXIAL GROWTH; HEAT TREATMENT; MICA; MICROSCOPIC EXAMINATION; MOLECULAR CRYSTALS; MONOMERS; POLYMERIZATION; SUBSTRATES; THERMAL EXPANSION; THIN FILMS;

HIGH RESOLUTION ELECTRON MICROSCOPY; MOLECULAR IMAGING; MOLECULAR PACKING; THIN PHTHALOCYANINE SILOXANE FILMS; VACUUM DEPOSITION;

CYANIDES;

EID: 0027693857     PISSN: 08876266     EISSN: 10990488     Source Type: Journal    
DOI: 10.1002/polb.1993.090311207     Document Type: Article

References (18)

1. Highly conducting iodinated fluoroaluminium and fluorogallium phthalocyanine polymers
2. Direct Molecular Imaging Of Low Dimensional Solids By High Resolution Electron Microscopy
3. Cofacial assembly of partially oxidized metallamacrocycles as an approach to controlling lattice architecture in low-dimensional molecular solids. Chemical and architectural properties of the "face-to-face" polymers [M(phthalocyaninato)O]n, where M = Si, Ge, and Sn