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Volumn 29, Issue 21, 1993, Pages 1847-1848
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Propagation loss characteristics of long silica-based optical waveguides on 5 inch Si wafers
a a a a
a
NTT CORPORATION
(Japan)
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Author keywords
Optical loss measurement; Optical waveguides
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Indexed keywords
DOPING (ADDITIVES);
ELECTRIC LOSSES;
LIGHT PROPAGATION;
OPTICAL SWITCHES;
OPTICAL VARIABLES MEASUREMENT;
SEMICONDUCTING SILICON;
BENDING CURVATURES;
OPTICAL LOSS MEASUREMENT;
PLANAR LIGHTWAVE CIRCUITS;
PROPAGATION LOSS CHARACTERISTICS;
OPTICAL WAVEGUIDES;
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EID: 0027685348
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19931229 Document Type: Article |
Times cited : (39)
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References (4)
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