Ellipsoidal Method for Design Centering and Yield Estimation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 12, Issue 10, 1993, Pages 1570-1579

  Wojciechowski, Jacek M ^a   Vlach, Jiri ^b  

^a UNIVERSITY OF WARSAW   (Poland)

^b UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CONSTRAINT THEORY; COSTS; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK SYNTHESIS; FITS AND TOLERANCES; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PRODUCT DESIGN; VECTORS;

CIRCUIT SIMULATION; CONSTRAINT REGION APPROXIMATION; DESIGN CENTERING; ELLIPSOID CENTER; ELLIPSOIDAL METHOD; EXTREME POINTS; TAYLOR SERIES APPROXIMATION; YIELD ESTIMATION;

COMPUTER AIDED DESIGN;

EID: 0027685168     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.256932     Document Type: Article

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