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Volumn 32, Issue 28, 1993, Pages 5504-5510

Direct observation of waveguided scattered light in multilayer dielectric thin films

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; FILM PREPARATION; LASER BEAMS; LIGHT SCATTERING; MULTILAYER FILMS; MULTILAYERS; DIELECTRIC MATERIALS; OPTICAL WAVEGUIDES; THIN FILMS;

EID: 0027684949     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.32.005504     Document Type: Article
Times cited : (7)

References (17)
  • 1
    • 0017551543 scopus 로고
    • Infrared light scattering from surfaces covered with multiple dielectric overlayers
    • J. M. Elson, “Infrared light scattering from surfaces covered with multiple dielectric overlayers,” Appl. Opt. 16, 2872-2881(1977).
    • (1977) Appl. Opt. , vol.16 , pp. 2872-2881
    • Elson, J.M.1
  • 2
    • 25944463779 scopus 로고
    • Surface roughness and the optical properties of a semi-infinite material; the effect of a dielectric overlayer
    • D. L. Mills and A. A. Maradudin, “Surface roughness and the optical properties of a semi-infinite material; the effect of a dielectric overlayer,” Phys. Rev. B 12, 2943-2958 (1975).
    • (1975) Phys. Rev. B , vol.12 , pp. 2943-2958
    • Mills, D.L.1    Maradudin, A.A.2
  • 3
    • 0018441882 scopus 로고
    • Scalar scattering theory for multilayer optical coatings
    • C. K. Carniglia, “Scalar scattering theory for multilayer optical coatings,” Opt. Eng. 18, 104-115 (1979).
    • (1979) Opt. Eng. , vol.18 , pp. 104-115
    • Carniglia, C.K.1
  • 4
    • 0042827478 scopus 로고
    • Interface roughness cross-correlation laws deduced from scattering diagram measurements on optical multilayers: Effect of the material grain size
    • C. Amra, P. Roche, and E. Pelletier, “Interface roughness cross-correlation laws deduced from scattering diagram measurements on optical multilayers: effect of the material grain size,” J. Opt. Soc. Am. B 4, 1087-1093 (1987).
    • (1987) J. Opt. Soc. Am. B , vol.4 , pp. 1087-1093
    • Amra, C.1    Roche, P.2    Pelletier, E.3
  • 5
    • 84893898214 scopus 로고
    • Statistical theory of rough boundaries for electromagnetic waves II. Statistical Green functions and scattering cross sections
    • K. Furutsu, “Statistical theory of rough boundaries for electromagnetic waves II. Statistical Green functions and scattering cross sections,” J. Opt. Soc. Am. A 2, 2260-2273 (1985).
    • (1985) J. Opt. Soc. Am. A , vol.2 , pp. 2260-2273
    • Furutsu, K.1
  • 6
    • 0020834662 scopus 로고
    • Relationship of the total integrated scattering from multilayer-coated optics to angle of incidence, polarization, correlation length, and roughness cross-correlation properties
    • J. M. Elson, J. P. Rahn, and J. M. Bennett, “Relationship of the total integrated scattering from multilayer-coated optics to angle of incidence, polarization, correlation length, and roughness cross-correlation properties,” Appl. Opt. 22, 3207-3219(1983).
    • (1983) Appl. Opt. , vol.22 , pp. 3207-3219
    • Elson, J.M.1    Rahn, J.P.2    Bennett, J.M.3
  • 7
    • 84957470350 scopus 로고
    • Surface scatter phenomena: A linear, shift-invariant process
    • J. C. Stover, ed., Proc. Soc. Photo-Opt. Instrum. Eng
    • J. E. Harvey, “Surface scatter phenomena: a linear, shift-invariant process,” in Scatter from Optical Components, J. C. Stover, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1165, 87-99(1989).
    • (1989) Scatter from Optical Components , vol.1165 , pp. 87-99
    • Harvey, J.E.1
  • 8
    • 11744306657 scopus 로고
    • Light scattering by thin films with a grating surface
    • M. G. Cavalcante, G. A. Farias, and A. A. Maradudin, “Light scattering by thin films with a grating surface,” J. Opt. Soc. Am. B 4, 1372-1378 (1987).
    • (1987) J. Opt. Soc. Am. B , vol.4 , pp. 1372-1378
    • Cavalcante, M.G.1    Farias, G.A.2    Maradudin, A.A.3
  • 9
    • 84975583923 scopus 로고
    • Analysis of anomalous resonance effects in multilayer-overcoated, low-efficiency gratings
    • J. M. Elson, L. F. DeSandre, and J. L. Stanford, “Analysis of anomalous resonance effects in multilayer-overcoated, low-efficiency gratings,” J. Opt. Soc. Am. A 5, 74-88 (1988).
    • (1988) J. Opt. Soc. Am. A , vol.5 , pp. 74-88
    • Elson, J.M.1    Desandre, L.F.2    Stanford, J.L.3
  • 11
    • 79958775884 scopus 로고
    • Roughness-induced scattering and attenuation of guided modes in slab waveguides
    • M. Arnz and H.-E. Ponath, “Roughness-induced scattering and attenuation of guided modes in slab waveguides,” J. Opt. Soc. Am. A 3, 2055-2068 (1986).
    • (1986) J. Opt. Soc. Am. A , vol.3 , pp. 2055-2068
    • Arnz, M.1    Ponath, H.-E.2
  • 12
    • 0000931443 scopus 로고
    • Optical characterization of thin films by guided waves
    • E. Pelletier, F. Flory, and Y. Hu, “Optical characterization of thin films by guided waves,” Appl. Opt. 28, 2918-2924 (1989).
    • (1989) Appl. Opt. , vol.28 , pp. 2918-2924
    • Pelletier, E.1    Flory, F.2    Hu, Y.3
  • 13
    • 17944363086 scopus 로고
    • Production of resonator optics for the 1315 nm oxygen iodine laser
    • P. M. Fauchet and K. H. Guenther, eds., Proc. Soc. Photo-Opt. Instrum. Eng
    • C. K. Carniglia and B. Pond, “Production of resonator optics for the 1315 nm oxygen iodine laser,” in Laser Optics for Intracavity and Extracavity Applications, P. M. Fauchet and K. H. Guenther, eds., Proc. Soc. Photo-Opt. Instrum. Eng. 895, 281-287(1988).
    • (1988) Laser Optics for Intracavity and Extracavity Applications , vol.895 , pp. 281-287
    • Carniglia, C.K.1    Pond, B.2
  • 14
    • 0019544923 scopus 로고
    • Nodular defects in dielectric multilayers and thick single layers
    • K. H. Guenther, “Nodular defects in dielectric multilayers and thick single layers,” Appl. Opt. 20, 1034-1036 (1981).
    • (1981) Appl. Opt. , vol.20 , pp. 1034-1036
    • Guenther, K.H.1
  • 15
    • 0011934516 scopus 로고
    • Stress reduction in ion beam sputtered mixed oxide films
    • B. J. Pond, J. I. DeBar, C. K. Carniglia, and T. Raj, “Stress reduction in ion beam sputtered mixed oxide films,” Appl. Opt. 28, 2800-2805 (1989).
    • (1989) Appl. Opt , vol.28 , pp. 2800-2805
    • Pond, B.J.1    Debar, J.I.2    Carniglia, C.K.3    Raj, T.4
  • 16
    • 0020914265 scopus 로고
    • Instrumentation of a variable angle scatterometer (VAS)
    • R. P. Breault, ed., Proc. Soc. Photo-Opt. Instrum. Eng
    • F. D. Orazio Jr., W. K. Stowell, and R. M. Silva, “Instrumentation of a variable angle scatterometer (VAS),” in Generation, Measurement and Control of Stray Radiation III, R. P. Breault, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 384, 123-131 (1983).
    • (1983) Generation, Measurement and Control of Stray Radiation III , vol.384 , pp. 123-131
    • Orazio, F.D.1    Stowell, W.K.2    Silva, R.M.3
  • 17
    • 0018996455 scopus 로고
    • Light scattering from multilayer optics: Comparison of theory and experiment
    • J. M. Elson, J. P. Rahn, and J. M. Bennett, “Light scattering from multilayer optics: comparison of theory and experiment,” Appl. Opt. 19, 669-679 (1980).
    • (1980) Appl. Opt. , vol.19 , pp. 669-679
    • Elson, J.M.1    Rahn, J.P.2    Bennett, J.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.