Computing reflectance ratios from an image

Pattern Recognition

Volumn 26, Issue 10, 1993, Pages 1529-1542

  Nayar, Shree K ^a   Bolle, Ruud M ^b  

^a Department of Computer Science Columbia University ^*  (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Connectivity; Inspection; Object recognition; Photometric invariant; Reflectance ratio; Region reflectance ratio; Sequential labeling; Surface reflectance

Indexed keywords

ALGORITHMS; COMPUTER VISION; INSPECTION; LIGHT REFLECTION; LIGHTING; OPTICAL PROPERTIES; PARAMETER ESTIMATION; SURFACE PROPERTIES;

CONNECTIVITY; OBJECT RECOGNITION; PHOTOMETRIC INVARIANT; REGION REFLECTANCE RATIO; SEQUENTIAL LABELING; SURFACE REFLECTANCE;

IMAGE ANALYSIS;

EID: 0027677402     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/0031-3203(93)90158-S     Document Type: Article

References (14)

1. Three-dimensional object recognition
2. Model-based recognition in robot vision
3. The retinex
4. Lightness and retinex theory
5. Determining lightness from an image
6. Boundary conditions for lightness computation in Mondrian world
7. Colour object recognition
8. Surface reflection: physical and geometrical perspectives
9. Feature extraction on binary patterns
10. Local properties of binary images in two dimensions
11. Connectivity in digital pictures