1/f Noise Behavior in Semiconductor Laser Degradation

IEEE Photonics Technology Letters

Volumn 5, Issue 10, 1993, Pages 1165-1167

  Fukuda, Mitsuo ^a   Hirono, Takuo ^a   Kurosaki, Takeshi ^a   Kano, Fumiyoshi ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DETERIORATION; MATHEMATICAL MODELS; SEMICONDUCTOR QUANTUM WELLS; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE;

DISTRIBUTED FEEDBACK LASERS; MULTIPLE QUANTUM WELL STRUCTURES; RESIDUAL SPECTRAL LINEWIDTH;

SEMICONDUCTOR LASERS;

EID: 0027677374     PISSN: 10411135     EISSN: 19410174     Source Type: Journal    
DOI: 10.1109/68.248415     Document Type: Article

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