Modulation spectroscopy of semiconductors: Bulk/thin film, microstructures, surfaces/interfaces and devices

Materials Science and Engineering R: Reports

Volumn 10, Issue 7-8, 1993, Pages 275-374

  Pollak, Fred H ^a   Shen, H ^b,c  

^a CITY UNIVERSITY OF NEW YORK   (United States)

^b U S ARMY RESEARCH LABORATORY   (United States)

^c SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; HETEROJUNCTIONS; INTERFACES (MATERIALS); SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICES; SEMICONDUCTOR GROWTH; SEMICONDUCTOR QUANTUM WELLS; SEMICONDUCTOR SUPERLATTICES; SPECTROSCOPY; SPECTRUM ANALYSIS; SURFACES; THIN FILMS;

MODULATION SPECTROSCOPY;

SEMICONDUCTOR MATERIALS;

EID: 0027677195     PISSN: 0927796X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (483)