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Volumn 2, Issue 3, 1993, Pages 128-137

Theoretical Modeling of Microfabricated Beams with Elastically Restrained Supports

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); DYNAMIC LOADS; ELASTICITY TESTING; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; MECHANICAL VARIABLES CONTROL; MICROELECTROMECHANICAL DEVICES; MICROMACHINING; SILICON STEEL; STRUCTURAL MEMBERS; TORSIONAL STRESS;

EID: 0027668578     PISSN: 10577157     EISSN: 19410158     Source Type: Journal    
DOI: 10.1109/84.260257     Document Type: Article
Times cited : (58)

References (9)
  • 1
    • 0001951875 scopus 로고
    • Microfabricated structures for the measurement of mechanical properties and adhesion of thin films
    • Tokyo, Japan, June
    • S. D. Senturia, “Microfabricated structures for the measurement of mechanical properties and adhesion of thin films,” in Tech. Dig. 4th Int. Conf. Solid-State Transducers, Tokyo, Japan, June 1987, pp. 11-16.
    • (1987) Tech. Dig. 4th Int. Conf. Solid-State Transducers , pp. 11-16
    • Senturia, S.D.1
  • 2
    • 33749944166 scopus 로고
    • A simple technique for the determination of mechanical strain in thin films with applications to polysilicon
    • Mar.
    • H. Guckel, T. Randazzo, and D. W. Burns, “A simple technique for the determination of mechanical strain in thin films with applications to polysilicon,” J. Appl. Phys., Vol. 57, pp. 1671-1675, Mar. 1985.
    • (1985) J. Appl. Phys , vol.57 , pp. 1671-1675
    • Guckel, H.1    Randazzo, T.2    Burns, D.W.3
  • 3
    • 0020765912 scopus 로고
    • Polycrystalline silicon micromechan-ical beams
    • June
    • R. T. Howe and R. S. Muller, “Polycrystalline silicon micromechan-ical beams,” J. Electrochem. Soc, Vol. 130, pp. 1420-1423, June 1983.
    • (1983) J. Electrochem. Soc , vol.130 , pp. 1420-1423
    • Howe, R.T.1    Muller, R.S.2
  • 4
    • 0024141318 scopus 로고
    • Characterization of the mechanisms producing bending moments in polysilicon microcantilever beams by interferometric deflection measurements
    • Hilton Head, SC, June
    • T. A. Lober, J. Huang, M. A. Schmidt, and S. D. Senturia, “Characterization of the mechanisms producing bending moments in polysilicon microcantilever beams by interferometric deflection measurements,” in Tech. Dig. IEEE Solid State Sensor and Actuator Workshop, Hilton Head, SC, June 1988, pp. 92–95.
    • (1988) Tech. Dig. IEEE Solid State Sensor and Actuator Workshop , pp. 92-95
    • Lober, T.A.1    Huang, J.2    Schmidt, M.A.3    Senturia, S.D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.