3-Valued Trace-Based Fault Simulation of Synchronous Sequential Circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 12, Issue 9, 1993, Pages 1419-1424

  Song, Ohyoung Y ^a   Menon, P R ^b  

^a IBM   (United States)

^b UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; NETWORKS (CIRCUITS); SIMULATION;

SYNCHRONOUS SEQUENTIAL CIRCUITS; TRACE BASED FAULT SIMULATION;

FAILURE ANALYSIS;

EID: 0027664642     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.240090     Document Type: Article

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