메뉴 건너뛰기




Volumn 12, Issue 9, 1993, Pages 1368-1375

Compact Modeling of BJT Self-Heating in SPICE

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; SIMULATION; THERMAL EFFECTS;

EID: 0027660588     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.240084     Document Type: Article
Times cited : (30)

References (15)
  • 1
    • 0001974214 scopus 로고
    • Voltage feedback and thermal resistance in junction transistors
    • June
    • J. J. Sparks, “Voltage feedback and thermal resistance in junction transistors,” Proc. IEEE, vol. 46, pp. 1305–1306, June 1958.
    • (1958) Proc. IEEE , vol.46 , pp. 1305-1306
    • Sparks, J.J.1
  • 2
    • 0001775647 scopus 로고
    • Internal thermal feedback in four-poles especially in transistors
    • Aug.
    • O. Mueller, “Internal thermal feedback in four-poles especially in transistors,” Proc. IEEE, vol. 52, pp. 924–930, Aug. 1964.
    • (1964) Proc. IEEE , vol.52 , pp. 924-930
    • Mueller, O.1
  • 3
    • 0017526887 scopus 로고
    • The current dependency of the output conductance of voltage-driven bipolar transistors
    • Aug.
    • G. Meijer, “The current dependency of the output conductance of voltage-driven bipolar transistors,” IEEE J. Sol. St. Circuits, vol. SC-12, pp. 428–429, Aug. 1977.
    • (1977) IEEE J. Sol. St. Circuits , vol.SC-12 , pp. 428-429
    • Meijer, G.1
  • 4
    • 84944292246 scopus 로고
    • The effect of thermal feedback within the bipolar transistor on Gummel-Poon model accuracy
    • May
    • W. F. Davis and M. L. Lidke, “The effect of thermal feedback within the bipolar transistor on Gummel-Poon model accuracy,” Motorola Internal Rep. May 1988.
    • (1988) Motorola Internal Rep
    • Davis, W.F.1    Lidke, M.L.2
  • 6
    • 0026222733 scopus 로고
    • Simulating the current mirror with a self-heating BJT model
    • Sept.
    • P. C. Munro and F.Q. Ye, “Simulating the current mirror with a self-heating BJT model,” IEEE J. Solid-State Circuits, vol. 26, pp. 1321–1324, Sept. 1991.
    • (1991) IEEE J. Solid-State Circuits , vol.26 , pp. 1321-1324
    • Munro, P.C.1    Ye, F.Q.2
  • 7
    • 0026395273 scopus 로고
    • Scalable small-signal model for BJT self-heating
    • Dec.
    • R. M. Fox and S.G. Lee, “Scalable small-signal model for BJT selfheating,” IEEE Electron Dev. Lett., vol. 12, pp. 649–651, Dec. 1991.
    • (1991) IEEE Electron Dev. Lett. , vol.12 , pp. 649-651
    • Fox, R.M.1    Lee, S.G.2
  • 8
    • 0026221080 scopus 로고
    • Thermal parameter extraction for bipolar circuit modelling
    • Sept.
    • R. M. Fox and S.G. Lee, “Thermal parameter extraction for bipolar circuit modelling,” Electron. Lett., vol. 27, pp. 1719–1720, Sept. 1991.
    • (1991) Electron. Lett. , vol.27 , pp. 1719-1720
    • Fox, R.M.1    Lee, S.G.2
  • 9
    • 0017269965 scopus 로고
    • Computer simulation of integrated circuits in the presence of electrothermal interaction
    • Dec.
    • K. Fukahori and P. R. Gray, “Computer simulation of integrated circuits in the presence of electrothermal interaction,” IEEE J. Solid-State Circuits, vol. SC-11, pp. 834–846, Dec. 1976.
    • (1976) IEEE J. Solid-State Circuits , vol.SC-11 , pp. 834-846
    • Fukahori, K.1    Gray, P.R.2
  • 10
    • 0014834628 scopus 로고
    • Thermal properties of very fast transistors
    • Aug.
    • 110] R. C. Joy and E. S. Schlig, “Thermal properties of very fast transistors,” IEEE Trans. Electron. Devices, vol. ED-17, pp. 586–594, Aug. 1970.
    • (1970) IEEE Trans. Electron. Devices , vol.ED-17 , pp. 586-594
    • Joy, R.C.1    Schlig, E.S.2
  • 11
  • 12
    • 84944291598 scopus 로고
    • Predictive modeling of thermal effects in BJTs
    • June
    • D. T. Zweidinger, R. M. Fox, and S.G. Lee, “Predictive modeling of thermal effects in BJTs,” in Proc. NUPAD IV, pp. 219–224, June 1992.
    • (1992) Proc. NUPAD IV , pp. 219-224
    • Zweidinger, D.T.1    Fox, R.M.2    Lee, S.G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.