메뉴 건너뛰기




Volumn 40, Issue 9, 1993, Pages 1636-1644

77 K Versus 300 K Operation: The Quasi-Saturation Behavior of a DMOS Device and Its Fully Analytical Model

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DOPING (ADDITIVES); ELECTRIC CURRENT MEASUREMENT; SEMICONDUCTOR DEVICE MODELS;

EID: 0027656349     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.231569     Document Type: Article
Times cited : (15)

References (17)
  • 1
    • 0026820123 scopus 로고
    • Two-dimensional analysis of a BiNMOS transistor operating at 77 K using a modified PISCES program
    • Feb.
    • Y.W. Chen and J.B. Kuo, “Two-dimensional analysis of a BiNMOS transistor operating at 77 K using a modified PISCES program,” IEEE Trans. Electron. Devices, vol. 39, pp. 348–355, Feb. 1992.
    • (1992) IEEE Trans. Electron. Devices , vol.39 , pp. 348-355
    • Chen, Y.W.1    Kuo, J.B.2
  • 2
    • 0023104820 scopus 로고
    • Switching characteristics of scaled CMOS circuits at 77 K
    • Jan.
    • J.S.T. Huang, “Switching characteristics of scaled CMOS circuits at 77 K,” IEEE Trans. Electron Devices, vol. ED-34, pp. 101–106, Jan. 1987.
    • (1987) IEEE Trans. Electron Devices , vol.34 ED , pp. 101-106
    • Huang, J.S.T.1
  • 3
    • 0022753907 scopus 로고
    • Short-channel effects in MOSFET's at liquid-nitrogen temperature
    • J.C.S. Woo and J.D. Plummer, “Short-channel effects in MOSFET's at liquid-nitrogen temperature,” IEEE Trans. Electron Devices, vol. ED-33, pp. 1012–1019, 1986.
    • (1986) IEEE Trans. Electron Devices , vol.33 ED , pp. 1012-1019
    • Woo, J.C.S.1    Plummer, J.D.2
  • 4
    • 84941543898 scopus 로고
    • Two-dimensional analysis of low-temperature quasi-saturation behavior in a vertical DMOS power transistor operating at 77 K for derivation of a closed-form analytical model
    • presented at, Taipei, Taiwan, ROC, Nov.
    • C.M. Liu, K.H. Lou, and J.B. Kuo, “Two-dimensional analysis of low-temperature quasi-saturation behavior in a vertical DMOS power transistor operating at 77 K for derivation of a closed-form analytical model,” presented at the Int. Electron Devices and Materials Symp., Taipei, Taiwan, ROC, Nov. 1992.
    • (1992) the Int. Electron Devices and Materials Symp.
    • Liu, C.M.1    Lou, K.H.2    Kuo, J.B.3
  • 5
    • 0022809306 scopus 로고
    • Study of quasi-saturation in VDMOS transistors
    • Nov.
    • M.N. Darwish, “Study of quasi-saturation in VDMOS transistors,” IEEE Trans. Electron Devices, vol. ED-33, pp. 1710–1716, Nov. 1986.
    • (1986) IEEE Trans. Electron Devices , vol.33 ED , pp. 1710-1716
    • Darwish, M.N.1
  • 7
    • 84941543899 scopus 로고
    • Analysis of the quasi-saturation behavior considering the drain-to-source voltage and cell-spacing effects for a vertical DMOS power transistor
    • Oct.
    • K.H. Lou, C.M. Liu, and J.B. Kuo, “Analysis of the quasi-saturation behavior considering the drain-to-source voltage and cell-spacing effects for a vertical DMOS power transistor,” Solid State Electron., Oct. 1992.
    • (1992) Solid State Electron
    • Lou, K.H.1    Liu, C.M.2    Kuo, J.B.3
  • 8
    • 0012751621 scopus 로고
    • An analytical quasi-saturation model for vertical DMOS power transistor
    • Mar.
    • K.H. Lou, C.M. Liu, and J.B. Kuo, “An analytical quasi-saturation model for vertical DMOS power transistor,” IEEE Trans. Electron Devices, vol. 40, pp. 676–679, Mar. 1993.
    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 676-679
    • Lou, K.H.1    Liu, C.M.2    Kuo, J.B.3
  • 9
    • 0024718053 scopus 로고
    • MOS device modeling at 77 K
    • Aug.
    • S. Selberherr, “MOS device modeling at 77 K,” IEEE Trans. Electron Devices, vol. 36, pp. 1464–1473, Aug. 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 1464-1473
    • Selberherr, S.1
  • 10
    • 0018457220 scopus 로고
    • Temperature dependent threshold behavior of a depletion mode MOSFETs
    • Apr.
    • F.H. Gaensslen and R.C. Jaeger, “Temperature dependent threshold behavior of a depletion mode MOSFETs,” Solid State Electron., vol. 22, no. 4, pp. 423–430, Apr. 1979.
    • (1979) Solid State Electron. , vol.22 , Issue.4 , pp. 423-430
    • Gaensslen, F.H.1    Jaeger, R.C.2
  • 11
    • 0024717655 scopus 로고
    • BILOW—Simulation of low-temperature bipolar device behavior
    • Aug.
    • M. Chrzanowska-Jeske and R.C. Jaeger, “BILOW—Simulation of low-temperature bipolar device behavior,” IEEE Trans. Electron Devices, vol. 36, pp. 1475–1487, Aug. 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 1475-1487
    • Chrzanowska-Jeske, M.1    Jaeger, R.C.2
  • 12
    • 0009509593 scopus 로고
    • Carrier mobilities in silicon empirically related to doping and field
    • D.M. Caughey and R.E. Thomas, “Carrier mobilities in silicon empirically related to doping and field,” Proc. IEEE, vol. 55, pp. 2192–2193, 1967.
    • (1967) Proc. IEEE , vol.55 , pp. 2192-2193
    • Caughey, D.M.1    Thomas, R.E.2
  • 13
    • 0020087475 scopus 로고
    • Electron and hole mobilities in silicon as a function of concentration and temperature
    • Feb.
    • N.D. Arora, J.R. Hauser, and D.J. Roulston, “Electron and hole mobilities in silicon as a function of concentration and temperature,” IEEE Trans. Electron Devices, vol. ED-29, pp. 284–291, Feb. 1982.
    • (1982) IEEE Trans. Electron Devices , vol.29 ED , pp. 284-291
    • Arora, N.D.1    Hauser, J.R.2    Roulston, D.J.3
  • 14
    • 0025401607 scopus 로고
    • Physical DMOST modeling for high-voltage IC CAD
    • Mar.
    • Y.S. Kim and J.G. Fossum, “Physical DMOST modeling for high-voltage IC CAD,” IEEE Trans. Electron Devices, vol. 37, pp. 797–803, Mar. 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , pp. 797-803
    • Kim, Y.S.1    Fossum, J.G.2
  • 15
    • 84941490928 scopus 로고
    • Optimum design of power MOSFET's
    • Dec.
    • C. Hu, M.H. Chi, and V.M. Patel, “Optimum design of power MOSFET's,” IEEE Trans. Electron Devices, vol. ED-31, pp. 1693–1700, Dec. 1984.
    • (1984) IEEE Trans. Electron Devices , vol.31 ED , pp. 1693-1700
    • Hu, C.1    Chi, M.H.2    Patel, V.M.3
  • 16
    • 0016113965 scopus 로고
    • A simple theory to predict the threshold voltage of short-channel IGFETs
    • L.D. Yau, “A simple theory to predict the threshold voltage of short-channel IGFETs,” Solid State Electron., vol. 17, pp. 1069–1063, 1974.
    • (1974) Solid State Electron. , vol.17 , pp. 1069
    • Yau, L.D.1
  • 17
    • 0019214556 scopus 로고
    • A simple model of the threshold voltage of short and narrow channel IGFETs
    • G. Merckel, “A simple model of the threshold voltage of short and narrow channel IGFETs,” Solid State Electron., vol. 23, pp. 1207–1213, 1980.
    • (1980) Solid State Electron. , vol.23 , pp. 1207-1213
    • Merckel, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.