-
1
-
-
0026820123
-
Two-dimensional analysis of a BiNMOS transistor operating at 77 K using a modified PISCES program
-
Feb.
-
Y.W. Chen and J.B. Kuo, “Two-dimensional analysis of a BiNMOS transistor operating at 77 K using a modified PISCES program,” IEEE Trans. Electron. Devices, vol. 39, pp. 348–355, Feb. 1992.
-
(1992)
IEEE Trans. Electron. Devices
, vol.39
, pp. 348-355
-
-
Chen, Y.W.1
Kuo, J.B.2
-
2
-
-
0023104820
-
Switching characteristics of scaled CMOS circuits at 77 K
-
Jan.
-
J.S.T. Huang, “Switching characteristics of scaled CMOS circuits at 77 K,” IEEE Trans. Electron Devices, vol. ED-34, pp. 101–106, Jan. 1987.
-
(1987)
IEEE Trans. Electron Devices
, vol.34 ED
, pp. 101-106
-
-
Huang, J.S.T.1
-
3
-
-
0022753907
-
Short-channel effects in MOSFET's at liquid-nitrogen temperature
-
J.C.S. Woo and J.D. Plummer, “Short-channel effects in MOSFET's at liquid-nitrogen temperature,” IEEE Trans. Electron Devices, vol. ED-33, pp. 1012–1019, 1986.
-
(1986)
IEEE Trans. Electron Devices
, vol.33 ED
, pp. 1012-1019
-
-
Woo, J.C.S.1
Plummer, J.D.2
-
4
-
-
84941543898
-
Two-dimensional analysis of low-temperature quasi-saturation behavior in a vertical DMOS power transistor operating at 77 K for derivation of a closed-form analytical model
-
presented at, Taipei, Taiwan, ROC, Nov.
-
C.M. Liu, K.H. Lou, and J.B. Kuo, “Two-dimensional analysis of low-temperature quasi-saturation behavior in a vertical DMOS power transistor operating at 77 K for derivation of a closed-form analytical model,” presented at the Int. Electron Devices and Materials Symp., Taipei, Taiwan, ROC, Nov. 1992.
-
(1992)
the Int. Electron Devices and Materials Symp.
-
-
Liu, C.M.1
Lou, K.H.2
Kuo, J.B.3
-
5
-
-
0022809306
-
Study of quasi-saturation in VDMOS transistors
-
Nov.
-
M.N. Darwish, “Study of quasi-saturation in VDMOS transistors,” IEEE Trans. Electron Devices, vol. ED-33, pp. 1710–1716, Nov. 1986.
-
(1986)
IEEE Trans. Electron Devices
, vol.33 ED
, pp. 1710-1716
-
-
Darwish, M.N.1
-
7
-
-
84941543899
-
Analysis of the quasi-saturation behavior considering the drain-to-source voltage and cell-spacing effects for a vertical DMOS power transistor
-
Oct.
-
K.H. Lou, C.M. Liu, and J.B. Kuo, “Analysis of the quasi-saturation behavior considering the drain-to-source voltage and cell-spacing effects for a vertical DMOS power transistor,” Solid State Electron., Oct. 1992.
-
(1992)
Solid State Electron
-
-
Lou, K.H.1
Liu, C.M.2
Kuo, J.B.3
-
8
-
-
0012751621
-
An analytical quasi-saturation model for vertical DMOS power transistor
-
Mar.
-
K.H. Lou, C.M. Liu, and J.B. Kuo, “An analytical quasi-saturation model for vertical DMOS power transistor,” IEEE Trans. Electron Devices, vol. 40, pp. 676–679, Mar. 1993.
-
(1993)
IEEE Trans. Electron Devices
, vol.40
, pp. 676-679
-
-
Lou, K.H.1
Liu, C.M.2
Kuo, J.B.3
-
9
-
-
0024718053
-
MOS device modeling at 77 K
-
Aug.
-
S. Selberherr, “MOS device modeling at 77 K,” IEEE Trans. Electron Devices, vol. 36, pp. 1464–1473, Aug. 1989.
-
(1989)
IEEE Trans. Electron Devices
, vol.36
, pp. 1464-1473
-
-
Selberherr, S.1
-
10
-
-
0018457220
-
Temperature dependent threshold behavior of a depletion mode MOSFETs
-
Apr.
-
F.H. Gaensslen and R.C. Jaeger, “Temperature dependent threshold behavior of a depletion mode MOSFETs,” Solid State Electron., vol. 22, no. 4, pp. 423–430, Apr. 1979.
-
(1979)
Solid State Electron.
, vol.22
, Issue.4
, pp. 423-430
-
-
Gaensslen, F.H.1
Jaeger, R.C.2
-
11
-
-
0024717655
-
BILOW—Simulation of low-temperature bipolar device behavior
-
Aug.
-
M. Chrzanowska-Jeske and R.C. Jaeger, “BILOW—Simulation of low-temperature bipolar device behavior,” IEEE Trans. Electron Devices, vol. 36, pp. 1475–1487, Aug. 1989.
-
(1989)
IEEE Trans. Electron Devices
, vol.36
, pp. 1475-1487
-
-
Chrzanowska-Jeske, M.1
Jaeger, R.C.2
-
12
-
-
0009509593
-
Carrier mobilities in silicon empirically related to doping and field
-
D.M. Caughey and R.E. Thomas, “Carrier mobilities in silicon empirically related to doping and field,” Proc. IEEE, vol. 55, pp. 2192–2193, 1967.
-
(1967)
Proc. IEEE
, vol.55
, pp. 2192-2193
-
-
Caughey, D.M.1
Thomas, R.E.2
-
13
-
-
0020087475
-
Electron and hole mobilities in silicon as a function of concentration and temperature
-
Feb.
-
N.D. Arora, J.R. Hauser, and D.J. Roulston, “Electron and hole mobilities in silicon as a function of concentration and temperature,” IEEE Trans. Electron Devices, vol. ED-29, pp. 284–291, Feb. 1982.
-
(1982)
IEEE Trans. Electron Devices
, vol.29 ED
, pp. 284-291
-
-
Arora, N.D.1
Hauser, J.R.2
Roulston, D.J.3
-
14
-
-
0025401607
-
Physical DMOST modeling for high-voltage IC CAD
-
Mar.
-
Y.S. Kim and J.G. Fossum, “Physical DMOST modeling for high-voltage IC CAD,” IEEE Trans. Electron Devices, vol. 37, pp. 797–803, Mar. 1990.
-
(1990)
IEEE Trans. Electron Devices
, vol.37
, pp. 797-803
-
-
Kim, Y.S.1
Fossum, J.G.2
-
15
-
-
84941490928
-
Optimum design of power MOSFET's
-
Dec.
-
C. Hu, M.H. Chi, and V.M. Patel, “Optimum design of power MOSFET's,” IEEE Trans. Electron Devices, vol. ED-31, pp. 1693–1700, Dec. 1984.
-
(1984)
IEEE Trans. Electron Devices
, vol.31 ED
, pp. 1693-1700
-
-
Hu, C.1
Chi, M.H.2
Patel, V.M.3
-
16
-
-
0016113965
-
A simple theory to predict the threshold voltage of short-channel IGFETs
-
L.D. Yau, “A simple theory to predict the threshold voltage of short-channel IGFETs,” Solid State Electron., vol. 17, pp. 1069–1063, 1974.
-
(1974)
Solid State Electron.
, vol.17
, pp. 1069
-
-
Yau, L.D.1
-
17
-
-
0019214556
-
A simple model of the threshold voltage of short and narrow channel IGFETs
-
G. Merckel, “A simple model of the threshold voltage of short and narrow channel IGFETs,” Solid State Electron., vol. 23, pp. 1207–1213, 1980.
-
(1980)
Solid State Electron.
, vol.23
, pp. 1207-1213
-
-
Merckel, G.1
|