Accurate Transmission Line Characterization

IEEE Microwave and Guided Wave Letters

Volumn 3, Issue 8, 1993, Pages 247-249

  Williams, Dylan F ^a   Marks, Roger B ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DIELECTRIC MATERIALS; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC LOSSES; ELECTROMAGNETIC DISPERSION; ELECTROMAGNETIC WAVE TRANSMISSION; ERROR ANALYSIS; SEMICONDUCTING SILICON; SUBSTRATES; TRANSMISSION LINE THEORY;

CHARACTERISTIC IMPEDANCE; COPLANAR WAVEGUIDE TRANSMISSION;

DIELECTRIC WAVEGUIDES;

EID: 0027640650     PISSN: 10518207     EISSN: None     Source Type: Journal    
DOI: 10.1109/75.242226     Document Type: Article

References (10)

1. R. B. Marks and D. F. Williams, “Interconnection transmission line parameter characterization,” in 40th ARFTG Conf. Dig., Orlando, FL, Dec. 1992, pp. 88–95.
2. “A general waveguide circuit theory,” J. Res. Nat. Inst. Standard Technol., vol. 97, pp. 533–561, Sept.-Oct. 1992.
3. “Characteristic impedance determination using propagation constant measurement,” IEEE Microwave Guided Wave Lett., vol. 1, pp. 141–143, June 1991.
4. D.F. Williams and R. B. Marks, “Transmission line capacitance measurement,” IEEE Microwave Guided Wave Lett., vol. 1, pp. 243–245, Sept. 1991.
5. D. K. Walker, D. F. Williams, and J. M. Morgan, “Planar resistors for probe station calibration,” in 40th ARFTG Conf. Dig., Orlando, FL, Dec. 1992, pp. 1–9.
6. Y. C. Shih, “Broadband characterization of conductor-backed coplanar waveguide using accurate on-wafer measurement techniques,” Microwave J., vol. 34, pp. 95–105, Apr. 1991.
7. W.R. Eisenstadt and Y. Eo, “S-parameter-based IC interconnect transmission line characterization,” IEEE Trans. Comp., Hybrids, Manuf. Technol., vol. 15, pp. 483—490, Aug. 1992.
8. D. F. Williams, R. B. Marks, and A. Davidson, “Comparison of on-wafer calibrations,” in 38th ARFTG Conf. Dig., San Diego, CA, Dec. 1991, pp. 68–81.
9. D.F. Williams and R. B. Marks, “Calibrating on-wafer probes to the probe tips,” in 40th ARFTG Conf. Dig., Orlando, FL, Dec. 1992, pp. 136–143.
10. R. B. Marks, “A multiline method of network analyzer calibration,” IEEE Trans. Microwave Theory Tech., vol. 39, pp. 1205–1215, July 1991.