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Volumn 18, Issue 16, 1993, Pages 1361-1363

Profile measurement of optically rough surfaces by fiber-optic interferometry

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY MODULATION; NUMERICAL ANALYSIS; OPTICAL FIBERS; ROUGHNESS MEASUREMENT; SEMICONDUCTOR LASERS; SENSORS; SURFACE PHENOMENA;

EID: 0027640204     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.18.001361     Document Type: Article
Times cited : (48)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.