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Volumn 18, Issue 16, 1993, Pages 1361-1363
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Profile measurement of optically rough surfaces by fiber-optic interferometry
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Author keywords
[No Author keywords available]
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Indexed keywords
FREQUENCY MODULATION;
NUMERICAL ANALYSIS;
OPTICAL FIBERS;
ROUGHNESS MEASUREMENT;
SEMICONDUCTOR LASERS;
SENSORS;
SURFACE PHENOMENA;
FIZEAU INTERFEROMETER;
PROFILOMETRY;
INTERFEROMETERS;
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EID: 0027640204
PISSN: 01469592
EISSN: 15394794
Source Type: Journal
DOI: 10.1364/OL.18.001361 Document Type: Article |
Times cited : (48)
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References (8)
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