SCOPUS 정보 검색 플랫폼

Applied Optics

Volumn 32, Issue 19, 1993, Pages 3438-3441

Interferometric profiler for rough surfaces

(1) Caber, Paul J a

a WYKO Corporation (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICS; SURFACES; DIGITAL SIGNAL PROCESSING; SIGNAL PROCESSING; SURFACE MEASUREMENT;

ANILOX PRINTING ROLL; FRINGE MODULATION DETERMINATION; MACHINED STEEL SURFACES; OPTICAL SURFACE PROFILOMETRY;

ROUGHNESS MEASUREMENT; INTERFEROMETRY;

DIGITAL SIGNAL PROCESSING ALGORITHMS; INTERFEROMETRIC METHODS; INTERFEROMETRIC PROFILER; INTERFEROMETRIC TECHNIQUES; MEASUREMENT SPEED; SURFACE PROFILING; THREE-DIMENSIONAL PROFILES; THREE-DIMENSIONAL SURFACE PROFILES;

EID: 0027639146 PISSN: 1559128X EISSN: 21553165 Source Type: Journal
DOI: 10.1364/AO.32.003438 Document Type: Article

Times cited : (353)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.