OPTIMA: A Nonlinear Model Parameter Extraction Program with Statistical Confidence Region Algorithms

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 12, Issue 7, 1993, Pages 982-987

  Sharma, Mahesh S ^a   Arora, Narain D ^b  

^a MOTOROLA INC   (United States)

^b HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; CURVE FITTING; LEAST SQUARES APPROXIMATIONS; MOSFET DEVICES; REDUNDANCY; SEMICONDUCTOR DEVICE MODELS; SIMULATION; STATISTICAL METHODS; VLSI CIRCUITS;

EMPIRICAL PARAMETERS; MODEL PARAMETER OPTIMIZATION PROGRAM; NONLINEAR MODEL PARAMETER EXTRACTION PROGRAM; POST PROCESSOR; STATISTICAL CONFIDENCE REGION ALGORITHMS;

OPTIMIZATION;

EID: 0027634522     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.238034     Document Type: Article

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