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Volumn 40, Issue 7, 1993, Pages 1277-1283

A Novel Metal-Insulator-Metal Structure for Field-Programmable Devices

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CHEMICAL VAPOR DEPOSITION; ELECTRODES; INTEGRATED CIRCUIT MANUFACTURE; PLASMAS; SEMICONDUCTOR INSULATOR BOUNDARIES;

EID: 0027624772     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.216433     Document Type: Article
Times cited : (11)

References (11)
  • 1
    • 0024169876 scopus 로고
    • Dielectric based antifuse for logic and memory ICs
    • E. Hamdy et al., “Dielectric based antifuse for logic and memory ICs,” in IEDM Tech. Dig., 1988, p. 786.
    • (1988) IEDM Tech. Dig. , pp. 786
    • Hamdy, E.1
  • 2
    • 0024645788 scopus 로고
    • An architecture for electrically configurable gate arrays
    • A.B. Gamal et al., “An architecture for electrically configurable gate arrays,” IEEE J. Solid State Circuits, vol. 24, p. 394, 1989.
    • (1989) IEEE J. Solid State Circuits , vol.24 , pp. 394
    • Gamal, A.B.1
  • 3
    • 0026136716 scopus 로고
    • Scaled dielectric antifuse structure for field-programmable gate array applications
    • D.K.Y. Liu et al., “Scaled dielectric antifuse structure for field-programmable gate array applications,” IEEE Electron Device Lett., vol. 12, p. 151, 1991.
    • (1991) IEEE Electron Device Lett. , vol.12 , pp. 151
    • Liu, D.K.Y.1
  • 4
    • 0024139265 scopus 로고
    • A high reliability metallization system for a double metal 1.5 μm CMOS process
    • J. Nulty et al., “A high reliability metallization system for a double metal 1.5 μm CMOS process,” in Proc. 5th IEEE VMIC, 1988, pp. 453–459.
    • (1988) Proc. 5th IEEE VMIC , pp. 453-459
    • Nulty, J.1
  • 10
    • 0001635735 scopus 로고
    • The mechanism of self-healing electrical breakdown in MOS structures
    • N. Klein, “The mechanism of self-healing electrical breakdown in MOS structures,” IEEE Trans. Electron Devices, vol. ED-13, p. 788, 1966.
    • (1966) IEEE Trans. Electron Devices , vol.13 ED , pp. 788
    • Klein, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.