Focused-beam attenuated total-reflection technique on absorptive film in Kretschmann's configuration

Applied Optics

Volumn 32, Issue 16, 1993, Pages 2957-2962

  Chang, Keh Su ^a   Lin, Chin Hwa ^a   Chou, Chien ^b  

^a NATIONAL DEFENSE UNIVERSITY   (Taiwan)

^b NATIONAL YANG MING UNIVERSITY   (Taiwan)

Author keywords

Absorptance; Attenuated total reflection; Surface plasma wave; Transmittance

Indexed keywords

FILMS; REFLECTION;

ABSORPTIVE FILMS; FOCUSED-BEAM ATTENUATED TOTAL-REFLECTION TECHNIQUE; KRETSCHMANN'S CONFIGURATION; SURFACE-PLASMA WAVE (SPW);

OPTICS; ELECTROMAGNETIC WAVE REFLECTION;

ABSORPTANCE; ATTENUATED TOTAL REFLECTIONS; CONVENTIONAL ALGORITHMS; INTENSITY DISTRIBUTION; NORMALIZATION FACTORS; NORMALIZING SIGNAL; SURFACE PLASMA WAVES; TRANSMITTANCE;

EID: 0027614936     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.32.002957     Document Type: Article

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