Reliability of GaAs-Based Semiconductor Diode Lasers: 0.6–1.1 µm

IEEE Journal of Quantum Electronics

Volumn 29, Issue 6, 1993, Pages 2058-2067

  Yellen, S L ^a   Shepard, A H ^a   Dalby, R J ^a   Baumann, J A ^a   Serreze, H B ^a   Guido, T S ^a   Soltz, R ^a   Bystrom, K J ^a   Harding, C M ^a   Waters, R G ^a  

^a Microwave Component Group   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LASER DIODES; OPTICAL PUMPING; QUANTUM ELECTRONICS; RELIABILITY;

DIODE DEGRADATION; LIFETESTING; PUMP LASERS;

SEMICONDUCTOR LASERS;

EID: 0027612152     PISSN: 00189197     EISSN: 15581713     Source Type: Journal    
DOI: 10.1109/3.234469     Document Type: Article

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