메뉴 건너뛰기




Volumn 12, Issue 6, 1993, Pages 878-887

Design and Synthesis of Self-Checking VLSI Circuits

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; COMPUTATIONAL COMPLEXITY; ELECTRIC FAULT LOCATION; ELECTRIC NETWORK SYNTHESIS; ERROR ANALYSIS; ERROR DETECTION; INTEGRATED CIRCUIT LAYOUT; SEQUENTIAL CIRCUITS; VECTORS;

EID: 0027610679     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.229762     Document Type: Article
Times cited : (134)

References (40)
  • 1
    • 0020151687 scopus 로고
    • Derivation and calibration of a transient error reliability model
    • July
    • X. Castillo, S. R. McConnel, and D. P. Siewiorek, “Derivation and calibration of a transient error reliability model,” IEEE Trans. Com put., vol. C-31, pp. 658–671, July 1982.
    • (1982) IEEE Trans. Com put. , vol.C-31 , pp. 658-671
    • Castillo, X.1    McConnel, S.R.2    Siewiorek, D.P.3
  • 2
    • 0022717638 scopus 로고
    • Soft-error filtering: A solution to the reliability problem of future VLSI digital circuits
    • May
    • Y. Savaria, N. C. Rumin, J. F. Hayes, and V. K. Agarwal, “Soft-error filtering: A solution to the reliability problem of future VLSI digital circuits,” IEEE Proc., vol. 74, no. 5, pp. 669–683, May 1986.
    • (1986) IEEE Proc. , vol.74 , Issue.5 , pp. 669-683
    • Savaria, Y.1    Rumin, N.C.2    Hayes, J.F.3    Agarwal, V.K.4
  • 3
    • 0023400802 scopus 로고
    • Designing for concurrent error detection in VLSI: Application to a microprogram control unit
    • Aug.
    • M. M. Yen, W. K. Fuchs, and J. A. Abraham, “Designing for concurrent error detection in VLSI: Application to a microprogram control unit,” IEEE J. Solid-State Circuits, vol. SC-22, pp. 595–605, Aug. 1987.
    • (1987) IEEE J. Solid-State Circuits , vol.SC-22 , pp. 595-605
    • Yen, M.M.1    Fuchs, W.K.2    Abraham, J.A.3
  • 4
    • 0001305152 scopus 로고
    • Design of dynamically checked computers
    • Aug. Edinburgh, Scotland
    • W. C. Carter and P. R. Schneider, “Design of dynamically checked computers.” in Proc. IFIP ’68, vol. 2, Edinburgh, Scotland, Aug. 1968, pp. 878–883.
    • (1968) Proc. IFIP ’68 , vol.2 , pp. 878-883
    • Carter, W.C.1    Schneider, P.R.2
  • 5
    • 0015604443 scopus 로고
    • Design of totally self-checking circuits for m-out-of-n codes
    • Mar.
    • D. A. Anderson and G. Metze, “Design of totally self-checking circuits for m-out-of-n codes,” IEEE Trans. Comput., vol. C-22, pp. 263–269, Mar. 1973.
    • (1973) IEEE Trans. Comput. , vol.C-22 , pp. 263-269
    • Anderson, D.A.1    Metze, G.2
  • 6
    • 0017982079 scopus 로고
    • Strongly fault secure logic networks
    • June
    • J. E. Smith and G. Metze, “Strongly fault secure logic networks,” IEEE Trans. Comput., vol. C-27, pp. 491–499, June 1978.
    • (1978) IEEE Trans. Comput. , vol.C-27 , pp. 491-499
    • Smith, J.E.1    Metze, G.2
  • 7
    • 0015602519 scopus 로고
    • Design of a self-checking microprogram control
    • Mar.
    • R. W. Cook, W. H. Sisson, T. F. Storey, and W. N. Toy, “Design of a self-checking microprogram control,” IEEE Trans. Comput., vol. C-22, pp. 255–262, Mar. 1973.
    • (1973) IEEE Trans. Comput. , vol.C-22 , pp. 255-262
    • Cook, R.W.1    Sisson, W.H.2    Storey, T.F.3    Toy, W.N.4
  • 8
    • 0018997934 scopus 로고
    • Error correcting codes and self-checking circuits in fault-tolerant computers
    • Mar.
    • D. K. Pradhan and J. J. Stiffler, “Error correcting codes and self-checking circuits in fault-tolerant computers,” IEEE Computer, vol. 13, pp. 27–37, Mar. 1980.
    • (1980) IEEE Computer , vol.13 , pp. 27-37
    • Pradhan, D.K.1    Stiffler, J.J.2
  • 10
    • 0019030422 scopus 로고
    • A new class of error correcting/detecting codes for fault tolerant applications
    • June
    • D. K. Pradhan, “A new class of error correcting/detecting codes for fault tolerant applications,” IEEE Trans. Comput., vol. C-29, pp. 471-481, June 1980.
    • (1980) IEEE Trans. Comput. , vol.C-29 , pp. 471-481
    • Pradhan, D.K.1
  • 11
    • 0019900434 scopus 로고    scopus 로고
    • Modified Berger codes for detection of unidirectional errors
    • June
    • H. Dong, “Modified Berger codes for detection of unidirectional errors,” in Proc. Int. Symp. Fault-Tolerant Comput., Santa Monica, June 317–320.
    • Proc. Int. Symp. Fault-Tolerant Comput. , pp. 317-320
    • Dong, H.1
  • 12
    • 0022147652 scopus 로고
    • Systematic unidirectional error-detecting codes
    • Nov.
    • B. Bose and D. J. Lin, “Systematic unidirectional error-detecting codes,” IEEE Trans. Comput., vol. C-34, pp. 1026–1032. Nov. 1985.
    • (1985) IEEE Trans. Comput. , vol.C-34 , pp. 1026-1032
    • Bose, B.1    Lin, D.J.2
  • 13
    • 0023171188 scopus 로고
    • A systematic code for detecting t-uni directional errors
    • June Pittsburgh, PA
    • N. K. Jha and M. B. Vora, “A systematic code for detecting t-uni directional errors,” in Proc. Int. Symp. Fault-Tolerant Comput., Pittsburgh, PA, June 1987, pp. 96–101.
    • (1987) Proc. Int. Symp. Fault-Tolerant Comput. , pp. 96-101
    • Jha, N.K.1    Vora, M.B.2
  • 14
    • 0022700736 scopus 로고
    • Burst unidirectional error detecting codes
    • Apr.
    • B. Bose, “Burst unidirectional error detecting codes,” IEEE Trans. Comput., vol. C-35, pp. 350–353, Apr. 1986.
    • (1986) IEEE Trans. Comput. , vol.C-35 , pp. 350-353
    • Bose, B.1
  • 15
    • 0023998706 scopus 로고
    • On systematic burst unidirectional error detecting codes
    • Apr.
    • M. Blaum, “On systematic burst unidirectional error detecting codes,” IEEE Trans. Comput., vol. C-37, pp. 453–457, Apr. 1988.
    • (1988) IEEE Trans. Comput. , vol.C-37 , pp. 453-457
    • Blaum, M.1
  • 16
    • 0024663396 scopus 로고
    • Separable codes for detecting unidirectional errors
    • May
    • N. K. Jha, “Separable codes for detecting unidirectional errors,” IEEE Trans. Computer-Aided Design, vol. CAD-8, pp. 571–574, May 1989.
    • (1989) IEEE Trans. Computer-Aided Design , vol.CAD-8 , pp. 571-574
    • Jha, N.K.1
  • 17
    • 0017633259 scopus 로고
    • The design of totally self-checking combinational circuits
    • June Los Angeles, CA
    • J. E. Smith and G. Metze, “The design of totally self-checking combinational circuits,” in Proc. Int. Symp. Fault-Tolerant Comput., Los Angeles, CA, June 1977, pp. 130–134.
    • (1977) in Proc. Int. Symp. Fault-Tolerant Comput. , pp. 130-134
    • Smith, J.E.1    Metze, G.2
  • 18
    • 84936893885 scopus 로고
    • Design of totally self-checking and fail safe sequential machines
    • June Urbana, IL
    • M. Diaz, “Design of totally self-checking and fail safe sequential machines,” in Proc. Int. Symp. Fault-Tolerant Comput., Urbana, IL, June 1974, pp. 3–9-3–24.
    • (1974) Proc. Int. Symp. Fault-Tolerant Comput. , pp. 3-9-3-24
    • Diaz, M.1
  • 19
    • 0017728337 scopus 로고
    • Design of totally self-checking asynchronous sequential machines
    • June
    • F. Ozguner, “Design of totally self-checking asynchronous sequential machines,” in Proc. Int. Symp. Fault-Tolerant Comput., June 1977, pp. 124–129.
    • (1977) Proc. Int. Symp. Fault-Tolerant Comput. , pp. 124-129
    • Ozguner, F.1
  • 21
    • 0020812018 scopus 로고
    • A theory of totally self-checking system design
    • Sept.
    • J. E. Smith and P. Lam, “A theory of totally self-checking system design,” IEEE Trans. Comput., vol. C-32, pp. 831–844, Sept. 1983.
    • (1983) IEEE Trans. Comput. , vol.C-32 , pp. 831-844
    • Smith, J.E.1    Lam, P.2
  • 22
    • 0003035229 scopus 로고
    • A note on error detecting codes for asymmetric channels
    • Mar.
    • J. M. Berger, “A note on error detecting codes for asymmetric channels,” Information & Control, vol. 4, pp. 68–73, Mar. 1961.
    • (1961) Information & Control , vol.4 , pp. 68-73
    • Berger, J.M.1
  • 23
    • 0017524659 scopus 로고
    • On totally self-checking checkers for separable codes
    • Aug.
    • M. Ashjaee and J. M. Reddy, “On totally self-checking checkers for separable codes,” IEEE Trans. Comput., vol. C-26. pp. 737–744, Aug. 1977.
    • (1977) IEEE Trans. Comput. , vol.C-26. , pp. 737-744
    • Ashjaee, M.1    Reddy, J.M.2
  • 25
    • 0024140994 scopus 로고
    • The design of fast totally self-checking Berger code checkers based on Berger code partitioning
    • June Tokyo, Japan
    • J.C. Lo and S. Thanawastien, “The design of fast totally self-checking Berger code checkers based on Berger code partitioning,” in Proc. Int. Symp. Fault-Tolerant Comput., Tokyo, Japan, June 1988, pp. 226–231.
    • (1988) Proc. Int. Symp. Fault-Tolerant Comput. , pp. 226-231
    • Lo, J.C.1    Thanawastien, S.2
  • 26
    • 0021474338 scopus 로고
    • On separable unordered codes
    • Aug.
    • J. E. Smith, “On separable unordered codes,” IEEE Trans. Comput., vol. C-33, pp. 741–743, Aug. 1984.
    • (1984) IEEE Trans. Comput. , vol.C-33 , pp. 741-743
    • Smith, J.E.1
  • 27
    • 50549172985 scopus 로고
    • Optimal error detecting codes for completely asymmetric binary channels
    • Mar.
    • C. V. Frieman, “Optimal error detecting codes for completely asymmetric binary channels,” Information & Control, vol. 5, pp. 64–71. Mar. 1962.
    • (1962) Information & Control , vol.5 , pp. 64-71
    • Frieman, C.V.1
  • 28
    • 0016115597 scopus 로고
    • A note on self-checking checkers
    • Oct.
    • S. M. Reddy, “A note on self-checking checkers,” IEEE Trans. Comput., vol. C-23, pp. 1100–1102, Oct. 1974.
    • (1974) IEEE Trans. Comput. , vol.C-23 , pp. 1100-1102
    • Reddy, S.M.1
  • 29
    • 0017983864 scopus 로고
    • Efficient design of self-checking checker for m-out-of-n code
    • June
    • M. A. Marouf and A. D. Friedman, “Efficient design of self-checking checker for m-out-of-n code,” IEEE Trans. Comput., vol. C-27, pp. 482–490, June 1978.
    • (1978) IEEE Trans. Comput. , vol.C-27 , pp. 482-490
    • Marouf, M.A.1    Friedman, A.D.2
  • 30
    • 0020721089 scopus 로고
    • A new design method for w-out-of-n TSC checkers
    • Mar.
    • N. Gaitanis and C. Halatsis, “ A new design method for w-out-of-n TSC checkers,” IEEE Trans. Comput., vol. C-32, pp. 273–283, Mar. 1983.
    • (1983) IEEE Trans. Comput. , vol.C-32 , pp. 273-283
    • Gaitanis, N.1    Halatsis, C.2
  • 31
    • 0020499408 scopus 로고
    • A 3-level realization of totally self-checking checkers for w-out-of-n codes
    • June Milan, Italy
    • T. Nanya and Y. Tohma, “A 3-level realization of totally self-checking checkers for w-out-of-n codes,” in Proc. Int. Symp. Fault-Tolerant Comput., Milan, Italy, June 1983, pp. 173–176.
    • (1983) Proc. Int. Symp. Fault-Tolerant Comput. , pp. 173-176
    • Nanya, T.1    Tohma, Y.2
  • 32
    • 0021444671 scopus 로고
    • Design and application of self-testing comparators implemented with MOS PLA's
    • June
    • Y. Tamir and C. H. Sequin, “Design and application of self-testing comparators implemented with MOS PLA’s,” IEEE Trans. Comput., vol. C-33, pp. 493–506, June 1984.
    • (1984) IEEE Trans. Comput. , vol.C-33 , pp. 493-506
    • Tamir, Y.1    Sequin, C.H.2
  • 33
    • 0015671134 scopus 로고
    • Monotone functions in sequential circuits
    • Oct.
    • G. Mago, “Monotone functions in sequential circuits,” IEEE Trans. Comput., vol. C-22, pp. 928–933, Oct. 1973.
    • (1973) IEEE Trans. Comput. , vol.C-22 , pp. 928-933
    • Mago, G.1
  • 36
    • 0024168714 scopus 로고
    • MUSTANG: State assignment of finite state machines targeting multilevel logic implementations
    • Dec.
    • S. Devadas, H.K.T. Ma, A. R. Newton, and A. Sangiovanni-Vin-centelli, “MUSTANG: State assignment of finite state machines targeting multilevel logic implementations,” IEEE Trans. Computer-Aided Design, vol. 7, pp. 1290–1300, Dec. 1988.
    • (1988) IEEE Trans. Computer-Aided Design , vol.7 , pp. 1290-1300
    • Devadas, S.1    Ma, H.K.T.2    Newton, A.R.3    Sangiovanni-Vin-centelli, A.4
  • 38
    • 0025840764 scopus 로고
    • MUSE: A multilevel symbolic encoding algorithm for state assignment
    • Jan.
    • X. Due, G. Hachtel, B. Lin and A. R. Newton, “MUSE: A multilevel symbolic encoding algorithm for state assignment,” IEEE Trans. Computer-Aided Design, vol. 10, pp. 28–38, Jan. 1991.
    • (1991) IEEE Trans. Computer-Aided Design , vol.10 , pp. 28-38
    • Due, X.1    Hachtel, G.2    Lin, B.3    Newton, A.R.4
  • 40
    • 0023346714 scopus 로고
    • Design of fast self-testing checkers for a class of Berger codes
    • May
    • S. J. Piestrak, “Design of fast self-testing checkers for a class of Berger codes,” IEEE Trans. Comput., vol. C-36, pp. 629–634, May 1987.
    • (1987) IEEE Trans. Comput. , vol.C-36 , pp. 629-634
    • Piestrak, S.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.