A Transconductance Spectroscopy Approach to Device Level Surface State Characterization

IEEE Transactions on Electron Devices

Volumn 40, Issue 6, 1993, Pages 1172-1174

  Zhao, Jian H ^a   Hwang, Robert ^a   Chang, Steve ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SPECTROSCOPIC ANALYSIS;

DEVICE LEVEL SURFACE STATE CHARACTERIZATION; METAL-SEMICONDUCTOR FETS; SURFACE LEAKAGE CURRENT; TRANSCONDUCTANCE DISPERSION MAGNITUDE; TRANSCONDUCTANCE SPECTROSCOPY;

FIELD EFFECT TRANSISTORS;

EID: 0027610559     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.214747     Document Type: Article

References (8)

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