The Effects of BJT Self-Heating on Circuit Behavior

IEEE Journal of Solid-State Circuits

Volumn 28, Issue 6, 1993, Pages 678-685

  Lee, Sang Gug ^b   Zweidinger, David T ^a  

^a UNIVERSITY OF FLORIDA   (United States)

^b INTERSIL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC IMPEDANCE; THERMAL EFFECTS;

BIPOLAR JUNCTION TRANSISTOR; ELECTRONIC DEVICES; SELF HEATING; SPICE; THERMAL IMPEDANCE;

BIPOLAR TRANSISTORS;

EID: 0027609967     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.217983     Document Type: Article

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