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Volumn 68, Issue 2, 1993, Pages 179-188
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Structure and composition of the surfaces of sputtered YBa2Cu3O7-δ thin films - an XPS and LEED study
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SIEMENS AG
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPOSITION;
COPPER OXIDES;
CRYSTAL ORIENTATION;
EPITAXIAL GROWTH;
FILM GROWTH;
FILM PREPARATION;
SEMICONDUCTOR SUPERLATTICES;
SPUTTER DEPOSITION;
STRUCTURE (COMPOSITION);
THIN FILMS;
X RAY SPECTROSCOPY;
YTTRIUM COMPOUNDS;
LOW ENERGY ELECTRON DIFFRACTION (LEED);
X RAY PHOTOELECTRON SPECTROSCOPY (XPS);
YTTRIUM BARIUM COPPER OXIDE;
SUPERCONDUCTING FILMS;
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EID: 0027609918
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/0169-4332(93)90119-V Document Type: Article |
Times cited : (16)
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References (22)
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