A Temperature-Stabilized SOI Voltage Reference Based on Threshold Voltage Difference Between Enhancement and Depletion NMOSFET's

IEEE Journal of Solid-State Circuits

Volumn 28, Issue 6, 1993, Pages 671-677

  Kim, Choong Ki ^b  

^a Hynix Semiconductor Inc   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; MOSFET DEVICES; SILICON ON INSULATOR TECHNOLOGY; VOLTAGE CONTROL; VOLTAGE MEASUREMENT;

NMOSFET; SIMOX; THRESHOLD VOLTAGE; VOLTAGE REFERENCE;

VOLTAGE STABILIZING CIRCUITS;

EID: 0027607209     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.217982     Document Type: Article

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