Reliability, Reconfiguration, and Spare Allocation Issues in Binary-Tree Architectures Based on Multiple-Level Redundancy

IEEE Transactions on Computers

Volumn 42, Issue 6, 1993, Pages 713-723

  Chen, Yung Yuan ^a   Upadhyaya, Shambhu J ^b  

^a CHUNG HUA UNIVERSITY   (Taiwan)

^b UNIVERSITY AT BUFFALO   (United States)

Author keywords

Fault tolerant architectures; modular scheme; multiple level redundancy; operational faults; optimal distribution; reconfiguration; reliability analysis; yield analysis

Indexed keywords

BINARY SEQUENCES; COMPUTATIONAL COMPLEXITY; ELECTRIC NETWORK TOPOLOGY; FAULT TOLERANT COMPUTER SYSTEMS; OPTIMAL SYSTEMS; PARALLEL PROCESSING SYSTEMS; REDUNDANCY; RELIABILITY; SYSTEMS ANALYSIS; TREES (MATHEMATICS);

BINARY TREE ARCHITECTURES; MODULAR SCHEME; MULTIPLE LEVEL REDUNDANCY TREE; OPERATIONAL FAULTS; OPTIMAL DISTRIBUTION; RECONFIGURATION; SPARE ALLOCATION; SUBTREE ORIENTED FAULT TOLERANCE; YIELD ANALYSIS;

COMPUTER ARCHITECTURE;

EID: 0027606572     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.277283     Document Type: Article

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