The electrostatic field in microstrip chambers and its influence on detector performance

Nuclear Inst. and Methods in Physics Research, A

Volumn 329, Issue 1-2, 1993, Pages 125-132

  Florent, J J ^a   Gaudaen, J ^a   Ropelewski, L ^a   Sauli, F ^a  

^a CERN   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC FIELDS; PARTICLE BEAM TRACKING; PERFORMANCE;

MICROSTRIP CHAMBERS;

PARTICLE DETECTORS;

EID: 0027594031     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(93)90927-A     Document Type: Article

References (10)

1. Proc. ECFA Study Week on Instrum. Techn. for High-Luminosity Hadron Colliders
2. Proc. ECFA Study Week on Instrum. Techn. for High-Luminosity Hadron Colliders
3. Proc IEEE Symposium on Nuclear Science
4. Proc. 5th Pisa Meeting on Advanced Detectors
5. Proc. Sixth Int. Wire Chamber Conf.
6. Multi-level adaptive solutions to boundary-value problems