-
2
-
-
0020152817
-
Concurrent error detection in ALUs by recomputing with shifted operands
-
July
-
J. H. Patel and L. Y. Fung, “Concurrent error detection in ALUs by recomputing with shifted operands,” IEEE Trans. Comput., vol. C-31, no. 7, pp. 589–595, July 1982.
-
(1982)
IEEE Trans. Comput.
, vol.C-31
, Issue.7
, pp. 589-595
-
-
Patel, J.H.1
Fung, L.Y.2
-
3
-
-
0023869356
-
The design of concurrent error detection diagnosable systolic array for band matrix multiplications
-
Jan.
-
S. W. Chan and C. L. Wey, “The design of concurrent error detection diagnosable systolic array for band matrix multiplications,” IEEE Trans. Computer-Aided Design, vol. 7, no. 1, pp. 21–37, Jan. 1988.
-
(1988)
IEEE Trans. Computer-Aided Design
, vol.7
, Issue.1
, pp. 21-37
-
-
Chan, S.W.1
Wey, C.L.2
-
4
-
-
78751619530
-
Efficient use of time and hardware redundancy for concurrent error detection in a 32-bit VLSI adder
-
Feb.
-
B. W. Johnson, J. H. Aylor, and H. H. Hana, “Efficient use of time and hardware redundancy for concurrent error detection in a 32-bit VLSI adder,” IEEE J. Solid-State Circuits, vol. 23, no. 1, pp. 208–215, Feb. 1988.
-
(1988)
IEEE J. Solid-State Circuits
, vol.23
, Issue.1
, pp. 208-215
-
-
Johnson, B.W.1
Aylor, J.H.2
Hana, H.H.3
-
5
-
-
0026190265
-
Fault-tolerant serial-parallel multiplier
-
July
-
L. G. Chen and T. H. Chen, “Fault-tolerant serial-parallel multiplier,” Proc. Inst. Elec. Eng., part E, vol. 138, no. 4, pp. 276–280, July 1991.
-
(1991)
Proc. Inst. Elec. Eng.
, vol.138
, Issue.4
, pp. 276-280
-
-
Chen, L.G.1
Chen, T.H.2
-
6
-
-
0024013596
-
A fault-tolerant FFT processor
-
May
-
Y. H. Choi and M. Malek, “A fault-tolerant FFT processor,” IEEE Trans. Comput., vol. 37, no. 5, pp. 617–621, May 1988.
-
(1988)
IEEE Trans. Comput.
, vol.37
, Issue.5
, pp. 617-621
-
-
Choi, Y.H.1
Malek, M.2
-
7
-
-
0024016403
-
Fault-tolerant FFT networks
-
May
-
J. Y. Jou and J. A. Abraham, “Fault-tolerant FFT networks,” IEEE Trans. Comput., vol. 37, no. 5, pp. 548–561, May 1988.
-
(1988)
IEEE Trans. Comput.
, vol.37
, Issue.5
, pp. 548-561
-
-
Jou, J.Y.1
Abraham, J.A.2
-
8
-
-
0025632212
-
A novel concurrent error detection scheme for FFT networks
-
D. L. Tao, C. R. P. Hartmann, and Y. S. Chen, “A novel concurrent error detection scheme for FFT networks,” in Proc. 20th IEEE Fault-Tolerant Computing Symp., 1990, 114—121.
-
(1990)
Proc. 20th IEEE Fault-Tolerant Computing Symp.
, pp. 114-121
-
-
Tao, D.L.1
Hartmann, C.R.P.2
Chen, Y.S.3
-
9
-
-
0022722967
-
Fault and error models for VLSI
-
May
-
J. A. Abraham and W. K. Fuchs, “Fault and error models for VLSI,” Proc. IEEE, vol. 74, no. 5, pp. 639–654, May 1986.
-
(1986)
Proc. IEEE
, vol.74
, Issue.5
, pp. 639-654
-
-
Abraham, J.A.1
Fuchs, W.K.2
-
10
-
-
0017937233
-
Error correction by alternate-data retry
-
Feb.
-
J. J. Shedletsky, “Error correction by alternate-data retry,” IEEE Trans. Comput., vol. C-27, no. 1, pp. 106–114, Feb. 1978.
-
(1978)
IEEE Trans. Comput.
, vol.C-27
, Issue.1
, pp. 106-114
-
-
Shedletsky, J.J.1
-
13
-
-
0023998952
-
A wafer-scale 170 000-gate FFT processor with built-in test circuits
-
Apr.
-
K. Yamashita et al. “A wafer-scale 170 000-gate FFT processor with built-in test circuits,” IEEE J. Solid-State Circuits, vol. 23, no. 2, pp. 336–342, Apr. 1988.
-
(1988)
IEEE J. Solid-State Circuits
, vol.23
, Issue.2
, pp. 336-342
-
-
Yamashita, K.1
-
15
-
-
0026866025
-
Concurrent error detection and fault location in an FFT architecture
-
May
-
F. Lombardi and J. C. Muzio, “Concurrent error detection and fault location in an FFT architecture,” IEEE J. Solid-State Circuits, vol. 27, no. 5, pp. 728–736, May 1992.
-
(1992)
IEEE J. Solid-State Circuits
, vol.27
, Issue.5
, pp. 728-736
-
-
Lombardi, F.1
Muzio, J.C.2
-
16
-
-
0023962696
-
A multiple-access pipeline architecture for digital signal processing
-
Mar.
-
B. C. Mckinnery and F. E. Guibaly, “A multiple-access pipeline architecture for digital signal processing,” IEEE Trans. Comput., vol. 37, no. 3, pp. 283–290, Mar. 1988.
-
(1988)
IEEE Trans. Comput.
, vol.37
, Issue.3
, pp. 283-290
-
-
Mckinnery, B.C.1
Guibaly, F.E.2
-
17
-
-
0022665434
-
Fault tolerant techniques for array structures used in supercomputing
-
Feb.
-
R. Negrini, M. Sami, and R. Stefanelli, “Fault tolerant techniques for array structures used in supercomputing,” IEEE Computer, pp. 78–87, Feb. 1986.
-
(1986)
IEEE Computer
, pp. 78-87
-
-
Negrini, R.1
Sami, M.2
Stefanelli, R.3
-
18
-
-
0020834827
-
The diogenes approach to testable fault tolerant VLSI processor arrays
-
Oct.
-
A. I. Rosenberg, “The diogenes approach to testable fault tolerant VLSI processor arrays,” IEEE Trans. Comput., vol. C-32, no. 10, pp. 902–910, Oct. 1983.
-
(1983)
IEEE Trans. Comput.
, vol.C-32
, Issue.10
, pp. 902-910
-
-
Rosenberg, A.I.1
-
19
-
-
0024612096
-
A built-in Hamming code ECC circuit for DRAM's
-
Feb.
-
K. Furutani et al. “A built-in Hamming code ECC circuit for DRAM's,” IEEE J. Solid-State Circuits, vol. 24, pp. 50–56, Feb. 1989.
-
(1989)
IEEE J. Solid-State Circuits
, vol.24
, pp. 50-56
-
-
Furutani, K.1
-
20
-
-
0026237182
-
High-speed on-chip ECC for synergistic fault-tolerant memory chips
-
Oct.
-
J. A. Fifield and C. H. Stapper, “High-speed on-chip ECC for synergistic fault-tolerant memory chips,” IEEE J. Solid-State Circuits, vol. 26, no. 10, pp. 1449–1452, Oct. 1991.
-
(1991)
IEEE J. Solid-State Circuits
, vol.26
, Issue.10
, pp. 1449-1452
-
-
Fifield, J.A.1
Stapper, C.H.2
|