메뉴 건너뛰기




Volumn 28, Issue 5, 1993, Pages 537-547

Concurrent Error-Detectable Butterfly Chip for Real-Time FFT Processing Through Time Redundancy

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; DIGITAL SIGNAL PROCESSING; FAST FOURIER TRANSFORMS; PROGRAM COMPILERS; SEMICONDUCTING SILICON;

EID: 0027592819     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.229402     Document Type: Article
Times cited : (8)

References (22)
  • 2
    • 0020152817 scopus 로고
    • Concurrent error detection in ALUs by recomputing with shifted operands
    • July
    • J. H. Patel and L. Y. Fung, “Concurrent error detection in ALUs by recomputing with shifted operands,” IEEE Trans. Comput., vol. C-31, no. 7, pp. 589–595, July 1982.
    • (1982) IEEE Trans. Comput. , vol.C-31 , Issue.7 , pp. 589-595
    • Patel, J.H.1    Fung, L.Y.2
  • 3
    • 0023869356 scopus 로고
    • The design of concurrent error detection diagnosable systolic array for band matrix multiplications
    • Jan.
    • S. W. Chan and C. L. Wey, “The design of concurrent error detection diagnosable systolic array for band matrix multiplications,” IEEE Trans. Computer-Aided Design, vol. 7, no. 1, pp. 21–37, Jan. 1988.
    • (1988) IEEE Trans. Computer-Aided Design , vol.7 , Issue.1 , pp. 21-37
    • Chan, S.W.1    Wey, C.L.2
  • 4
    • 78751619530 scopus 로고
    • Efficient use of time and hardware redundancy for concurrent error detection in a 32-bit VLSI adder
    • Feb.
    • B. W. Johnson, J. H. Aylor, and H. H. Hana, “Efficient use of time and hardware redundancy for concurrent error detection in a 32-bit VLSI adder,” IEEE J. Solid-State Circuits, vol. 23, no. 1, pp. 208–215, Feb. 1988.
    • (1988) IEEE J. Solid-State Circuits , vol.23 , Issue.1 , pp. 208-215
    • Johnson, B.W.1    Aylor, J.H.2    Hana, H.H.3
  • 5
    • 0026190265 scopus 로고
    • Fault-tolerant serial-parallel multiplier
    • July
    • L. G. Chen and T. H. Chen, “Fault-tolerant serial-parallel multiplier,” Proc. Inst. Elec. Eng., part E, vol. 138, no. 4, pp. 276–280, July 1991.
    • (1991) Proc. Inst. Elec. Eng. , vol.138 , Issue.4 , pp. 276-280
    • Chen, L.G.1    Chen, T.H.2
  • 6
    • 0024013596 scopus 로고
    • A fault-tolerant FFT processor
    • May
    • Y. H. Choi and M. Malek, “A fault-tolerant FFT processor,” IEEE Trans. Comput., vol. 37, no. 5, pp. 617–621, May 1988.
    • (1988) IEEE Trans. Comput. , vol.37 , Issue.5 , pp. 617-621
    • Choi, Y.H.1    Malek, M.2
  • 7
    • 0024016403 scopus 로고
    • Fault-tolerant FFT networks
    • May
    • J. Y. Jou and J. A. Abraham, “Fault-tolerant FFT networks,” IEEE Trans. Comput., vol. 37, no. 5, pp. 548–561, May 1988.
    • (1988) IEEE Trans. Comput. , vol.37 , Issue.5 , pp. 548-561
    • Jou, J.Y.1    Abraham, J.A.2
  • 9
    • 0022722967 scopus 로고
    • Fault and error models for VLSI
    • May
    • J. A. Abraham and W. K. Fuchs, “Fault and error models for VLSI,” Proc. IEEE, vol. 74, no. 5, pp. 639–654, May 1986.
    • (1986) Proc. IEEE , vol.74 , Issue.5 , pp. 639-654
    • Abraham, J.A.1    Fuchs, W.K.2
  • 10
    • 0017937233 scopus 로고
    • Error correction by alternate-data retry
    • Feb.
    • J. J. Shedletsky, “Error correction by alternate-data retry,” IEEE Trans. Comput., vol. C-27, no. 1, pp. 106–114, Feb. 1978.
    • (1978) IEEE Trans. Comput. , vol.C-27 , Issue.1 , pp. 106-114
    • Shedletsky, J.J.1
  • 13
    • 0023998952 scopus 로고
    • A wafer-scale 170 000-gate FFT processor with built-in test circuits
    • Apr.
    • K. Yamashita et al. “A wafer-scale 170 000-gate FFT processor with built-in test circuits,” IEEE J. Solid-State Circuits, vol. 23, no. 2, pp. 336–342, Apr. 1988.
    • (1988) IEEE J. Solid-State Circuits , vol.23 , Issue.2 , pp. 336-342
    • Yamashita, K.1
  • 15
    • 0026866025 scopus 로고
    • Concurrent error detection and fault location in an FFT architecture
    • May
    • F. Lombardi and J. C. Muzio, “Concurrent error detection and fault location in an FFT architecture,” IEEE J. Solid-State Circuits, vol. 27, no. 5, pp. 728–736, May 1992.
    • (1992) IEEE J. Solid-State Circuits , vol.27 , Issue.5 , pp. 728-736
    • Lombardi, F.1    Muzio, J.C.2
  • 16
    • 0023962696 scopus 로고
    • A multiple-access pipeline architecture for digital signal processing
    • Mar.
    • B. C. Mckinnery and F. E. Guibaly, “A multiple-access pipeline architecture for digital signal processing,” IEEE Trans. Comput., vol. 37, no. 3, pp. 283–290, Mar. 1988.
    • (1988) IEEE Trans. Comput. , vol.37 , Issue.3 , pp. 283-290
    • Mckinnery, B.C.1    Guibaly, F.E.2
  • 17
    • 0022665434 scopus 로고
    • Fault tolerant techniques for array structures used in supercomputing
    • Feb.
    • R. Negrini, M. Sami, and R. Stefanelli, “Fault tolerant techniques for array structures used in supercomputing,” IEEE Computer, pp. 78–87, Feb. 1986.
    • (1986) IEEE Computer , pp. 78-87
    • Negrini, R.1    Sami, M.2    Stefanelli, R.3
  • 18
    • 0020834827 scopus 로고
    • The diogenes approach to testable fault tolerant VLSI processor arrays
    • Oct.
    • A. I. Rosenberg, “The diogenes approach to testable fault tolerant VLSI processor arrays,” IEEE Trans. Comput., vol. C-32, no. 10, pp. 902–910, Oct. 1983.
    • (1983) IEEE Trans. Comput. , vol.C-32 , Issue.10 , pp. 902-910
    • Rosenberg, A.I.1
  • 19
    • 0024612096 scopus 로고
    • A built-in Hamming code ECC circuit for DRAM's
    • Feb.
    • K. Furutani et al. “A built-in Hamming code ECC circuit for DRAM's,” IEEE J. Solid-State Circuits, vol. 24, pp. 50–56, Feb. 1989.
    • (1989) IEEE J. Solid-State Circuits , vol.24 , pp. 50-56
    • Furutani, K.1
  • 20
    • 0026237182 scopus 로고
    • High-speed on-chip ECC for synergistic fault-tolerant memory chips
    • Oct.
    • J. A. Fifield and C. H. Stapper, “High-speed on-chip ECC for synergistic fault-tolerant memory chips,” IEEE J. Solid-State Circuits, vol. 26, no. 10, pp. 1449–1452, Oct. 1991.
    • (1991) IEEE J. Solid-State Circuits , vol.26 , Issue.10 , pp. 1449-1452
    • Fifield, J.A.1    Stapper, C.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.