An Improved Calibration Technique for On-Wafer Large–Signal Transistor Characterization

IEEE Transactions on Instrumentation and Measurement

Volumn 42, Issue 2, 1993, Pages 360-364

  Ferrero, Andrea ^a   Pisani, Umberto ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS; ERROR ANALYSIS; MATHEMATICAL MODELS; TRANSISTORS; WSI CIRCUITS;

ABSOLUTE POWER LEVELS; COAXIAL DIRECTIONAL COUPLERS; ON-WATER MEASUREMENT; TRANSISTOR CHARACTERIZATION;

CALIBRATION;

EID: 0027585391     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.278582     Document Type: Article

References (7)

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