Passing Electrons One By One: Is a 10–8 Accuracy Achievable?

IEEE Transactions on Instrumentation and Measurement

Volumn 42, Issue 2, 1993, Pages 324-330

  Pothier, H ^a   Lafarge, P ^b   Esteve, D ^b   Urbina, C ^b   Devoret, Michel H ^b  

^a H   (Germany)

^b CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; MEASUREMENTS; MODULATION; TUNNEL DIODES;

ERROR PROBABILITY; SIGNAL ELECTRON PUMP; SINGLE ELECTRON EFFECTS; TURNSTILE;

ELECTRON TUNNELING;

EID: 0027580756     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.278575     Document Type: Article

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