CRRES Microelectronics Test Package (MEP)

IEEE Transactions on Nuclear Science

Volumn 40, Issue 2, 1993, Pages 228-232

  Mullen, E G ^a   Ray, K P ^a  

^a Air Force Research Laboratory   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; MICROELECTRONICS; RADIATION SHIELDING; SATELLITES; SPACE RESEARCH;

COMBINED RELEASE AND RADIATION EFFECTS SATELLITE; MICROELECTRONICS TEST PACKAGE; SINGLE EVENT UPSETS; SPOT SHIELDING PACKAGE;

ELECTRONIC EQUIPMENT;

EID: 0027579201     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.212346     Document Type: Article

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