Secondary Emission Properties as a Function of the Electron Incidence Angle

IEEE Transactions on Electron Devices

Volumn 40, Issue 4, 1993, Pages 824-829

  Shih, Arnold ^a   Hor, Charles ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPUTER SOFTWARE; ELECTRON EMISSION; MOLYBDENUM;

CROSSED FIELD AMPLIFIERS; SECONDARY ELECTRONS;

AMPLIFIERS (ELECTRONIC);

EID: 0027578427     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.202797     Document Type: Article

References (14)

1. O. Hachenberg and W. Brauer, “Secondary electron emission from solids,” in Advances in Electronics and Electron Physics, L. Morton, Ed. New York and London: Academic Press, 1959.
2. A.J. Dekker, “Secondary electron emission,” in Solid State Physics, Advances in Research and Applications, F. Seitz and D. Turnbull, Eds. New York, San Francisco, and London: Academic Press, 1958.
3. R.O. Jenkins and W.G. Trodden, “Electron and ion emission from solids,” in Secondary Emission of Electrons. New York: Dover, 1965, ch. 6.
4. K.W. Dudley, Raytheon Corp. Rep., p. 643, 1961.
5. R. Kollath, Handbuch D. Physik, vol. 21, p. 232, 1956.
6. C. Bouchard and J.D. Cartte, Surface Sci., vol. 100, p. 241, 1980.
7. J.P. Ganachaud and M. Cailler, Surface Sci., vol. 83, p. 498, 1979.
8. A.R.R. Kunz and T.M. Mayer, J. Vac. Sci. Technol., vol. B6, no. 6, p. 2057, 1988.
9. Motera, J. Appl. Phys., vol. 65, p. 3991, 1989.
10. J.R.M. Vaughan, IEEE Trans. Electron Devices, vol. 36, p. 1963, 1989.
11. H. Braining, Physics and Applications of Secondary Electron Emission. London, UK: Pergamon, 1954.
12. V.H. Ritz, R.E. Thomas, J.W. Gibson, and J. Klebanoff, Surface Interface Anal., vol. 11, p. 389, 1988.
13. J.R.M. Vaughan, private communication.
14. N. Dionne, private communication.