Interpretation of force curves in force microscopy

Nanotechnology

Volumn 4, Issue 2, 1993, Pages 64-80

  Burnham, N A ^a   Colton, R J ^b   Pollock, H M ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

FORCE CURVES; FORCE INTERACTIONS; FORCE MICROSCOPY; FORCE SPECTROSCOPY; PATCH CHARGE MODEL;

CURVE FITTING; IMAGING TECHNIQUES; LOADS (FORCES); MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; SURFACES; VAN DER WAALS FORCES;

FORCE MEASUREMENT;

EID: 0027574428     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/4/2/002     Document Type: Article

References (63)

1. Scanned-Probe Microscopes
2. Proximal Probes: Techniques for Measuring at the Nanometer Scale
3. Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope
4. Nanomechanics of a Au–Ir contact using a bidirectional atomic force microscope
5. Interpretation issues in force microscopy
6. The Measurement of Van Der Waals Dispersion Forces in the Range 1.5 to 130 nm
7. On the stability of a tip and flat at very small separations
8. Localized charge force microscopy
9. Effect of Surface Patch Fields on Field-Emission Work-Function Determinations
10. Direct Measurement of the Short-Range Interaction Between a Tungsten Tip and a Mica Surface
11. Surface force measurements on picometer and piconewton scales
12. Surface Energy and the Contact of Elastic Solids