Noise properties of biepitaxial hts junctions

IEEE Transactions on Applied Superconductivity

Volumn 3, Issue 1, 1993, Pages 2319-2320

  Hammond, S G ^a   He, Y ^a   Muirhead, C M ^a   Wu, P ^a   Colclough, M S ^b   Char, K ^b  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b Conductus Inc ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; JOSEPHSON JUNCTION DEVICES; SEMICONDUCTOR JUNCTIONS; SPURIOUS SIGNAL NOISE;

BIEPITAXIAL JUNCTIONS; HTS JUNCTIONS;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0027560919     PISSN: 10518223     EISSN: 15582515     Source Type: Journal    
DOI: 10.1109/77.233438     Document Type: Letter

References (5)

1. A.H., Miklich, J., Clarke, K., Char, M.S., Colclough, Flicker noise in grain boundary junctions of YBCO,” App. Phys, Lett, 59, 1899, 1901 1992
2. M., Kawasaki, P., Chaudhari, A., Gupta, 1/f noise in YBCO superconducting bicrystal grain boundaru junctions, Phys, 68, 1065, 1068, February 1992
3. S.G., Hammond, Y., He, C.M., Muirhead, M.S., Colclough, K., Char, A phase-sensitive technique for the study of noise properties of HTS junctions
4. K., Char, M.S., Colclough, S.M., Garrison, N., Newman, G., Zararchuck, Extensions of the biepitaxial process to various substrates,” App. Phys, Lett, 60, 2177, 2179 1991
5. R.A., Buhrman, Experimental overview of HTS Josephson devices, Bull. APS, 37, 561 1992