Software-Reliability Growth with a Weibull Test-Effort: A Model & Application

IEEE Transactions on Reliability

Volumn 42, Issue 1, 1993, Pages 100-106

  Yamada, Shigeru ^a   Hishitani, Jun ^a   Osaki, Shunji ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

Additional test effort prediction; Nonhomogeneous Poisson process; Optimum software release time; Reliability growth modeling; Software reliability; Software testing; Weibull test effort function

Indexed keywords

PROBABILITY; RELIABILITY THEORY;

ADDITIONAL TEST-EFFORT PREDICTION; NONHOMOGENEOUS POISSON PROCESS; OPTIMUM SOFTWARE RELEASE TIME; SOFTWARE RELIABILITY GROWTH; SOFTWARE TESTING; WEIBULL TEST-EFFORT FUNCTION;

SOFTWARE ENGINEERING;

EID: 0027559945     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/24.210278     Document Type: Article

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