A Discrete Bayes Explanation of a Failure-Rate Paradox

IEEE Transactions on Reliability

Volumn 42, Issue 1, 1993, Pages 132-133

  Rodrigues, Flàvio W ^a   Wechsler, Sergio ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Bayes; Bernoulli trial; Decreasing failure rate; Exponential distribution; Predictive distribution; Prior opinion

Indexed keywords

PROBABILITY; RELIABILITY;

BERNOULLI TRIAL; EXPONENTIAL DISTRIBUTION; FAILURE-RATE PARADOX; PREDICTIVE FAILURE RATES; PRIOR OPINION;

FAILURE ANALYSIS;

EID: 0027558238     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/24.210284     Document Type: Article

References (2)

1. R. E. Barlow, “A Bayes explanation of an apparent failure rate paradox”, IEEE Trans. Reliability, vol R-34, 1985 Jun, pp 107–108.
2. J. v. Plato, “On partial exchangeability as a generalization of symmetry principles”, Erkenntnis vol 16, 1981, pp 53–59.